Surface relief accompanying martensitic transitions in an Fe-Ni-C alloy by atomic-force microscopy and phenomenological theory of martensitic crystallography

1995 ◽  
Vol 52 (11) ◽  
pp. 7879-7882 ◽  
Author(s):  
Zhi-Gang Yang ◽  
Hong-Sheng Fang ◽  
Jia-Jun Wang ◽  
Chun-Ming Li ◽  
Yan-Kang Zheng
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Relief ◽  
Phenomenological Theory ◽  
Force Microscopy ◽  
Atomic Force

Surface relief grating formation in luminescent dye doped photochromic polymer containing azobenzene side groups

Open Physics ◽  
2013 ◽  
Vol 11 (8) ◽  
Author(s):  
Lech Sznitko ◽  
Pawel Karpinski ◽  
Stanislaw Bartkiewicz ◽  
Andrzej Miniewicz ◽  
Jaroslaw Mysliwiec
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Relief ◽  
Rhodamine 6G ◽  
Thin Layers ◽  
Force Microscopy ◽  
Surface Relief Grating ◽  
Atomic Force ◽  
Photochromic Polymers ◽  
Photochromic Polymer ◽  
Grating Formation

AbstractWe study the formation of a surface relief grating and photoluminescence in a thin layers of a photochromic polymer doped with the luminescent dyes 3-(1,1-dicyanoethenyl)-1-phenyl-4,5-dihydro-1H-pyrazole and Rhodamine 6G. Surface topography measurements via Atomic Force Microscopy confirmed the existence of a surface relief grating with amplitudes as high as 650 nm both for doped and undoped photochromic polymers. Spectroscopic measurements carried out for polymers containing luminescent dyes have shown efficient photoluminescence and amplified spontaneous emission which is characteristic for gain media.

Surface relief associated with martensite and bainite in a Cu–Zn–Al alloy measured by atomic force microscopy

1996 ◽  
Vol 79 (12) ◽  
pp. 9129-9133 ◽  
Author(s):  
Zhi‐Gang Yang ◽  
Hong‐Sheng Fang ◽  
Jia‐Jun Wang ◽  
Chun‐Ming Li ◽  
Xiang‐Zheng Bao ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Relief ◽  
Al Alloy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Сравнение СТМ и АСМ измерений тонких пленок Mo с моделью Кардара-Паризи-Жанга

2021 ◽  
Vol 91 (10) ◽  
pp. 1466
Author(s):  
Л.А. Фомин ◽  
И.В. Маликов ◽  
В.А. Березин ◽  
А.Э. Рассадин ◽  
А.Б. Логинов ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Surface Relief ◽  
Epitaxial Films ◽  
Experimental Results ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force

The relief of thin Mo epitaxial films grown on the R-plane of sapphire has been studied by scanning tunneling microscopy and atomic force microscopy. The region of parameters of the model of the evolution of the surface relief of the Kardar-Parisi-Zhang films is found, in which it corresponds to the obtained experimental results.

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