Phase-field model of domain structures in ferroelectric thin films

2001 ◽  
Vol 78 (24) ◽  
pp. 3878-3880 ◽  
Author(s):  
Y. L. Li ◽  
S. Y. Hu ◽  
Z. K. Liu ◽  
L. Q. Chen
2000 ◽  
Vol 652 ◽  
Author(s):  
Y. L. Li ◽  
S. Y. Hu ◽  
Z. K. Liu ◽  
L. Q. Chen

ABSTRACTA phase-field model for predicting the domain structure evolution in constrained ferroelectric thin films is developed. It employs an analytical elastic solution derived for a constrained film with arbitrary eigenstrain distributions. In particular, the model is applied to the domain structure evolution during a cubic→tetragonal proper ferro- electric phase transition. The effect of substrate constraint on the volume fractions of domain variants, domain-wall orientations, and domain shapes is studied. It is shown that the predicted results agree very well with existing experimental observations in ferroelectric thin films.


RSC Advances ◽  
2019 ◽  
Vol 9 (13) ◽  
pp. 7575-7586 ◽  
Author(s):  
Le Van Lich ◽  
Van-Hai Dinh

New phase field model to reveal switching mechanism of needle domain in compositionally graded ferroelectric thin film.


2015 ◽  
Vol 83 ◽  
pp. 333-340 ◽  
Author(s):  
H.B. Huang ◽  
X.Q. Ma ◽  
J.J. Wang ◽  
Z.H. Liu ◽  
W.Q. He ◽  
...  

2010 ◽  
Vol 77 (4) ◽  
Author(s):  
Antonios Kontsos ◽  
Chad M. Landis

A computational model developed based on the phase-field approach is used to model domain structures in ferroelectric thin films and to quantify the effects of strain and applied electric field on the microstructural evolution, and on the induced dielectric, electrostrictive, and piezoelectric film properties. Theoretically predicted vortex-like polydomain and experimentally observed bidomain and monodomain film morphologies are modeled using the continuum phase-field approach. A nonlinear finite element method is used to solve the boundary value problems relevant to ferroelectric thin films. The computed results agree with the Kittel law for specific ranges of film strain. Simulations that track the domain structure evolution and compute ferroelectric thin film properties given the film dimensions and the imposed electromechanical boundary conditions are also reported.


2007 ◽  
Vol 90 (5) ◽  
pp. 052909 ◽  
Author(s):  
J. X. Zhang ◽  
Y. L. Li ◽  
D. G. Schlom ◽  
L. Q. Chen ◽  
F. Zavaliche ◽  
...  

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