scholarly journals Formation of polarization needle-like domain and its unusual switching in compositionally graded ferroelectric thin films: an improved phase field model

RSC Advances ◽  
2019 ◽  
Vol 9 (13) ◽  
pp. 7575-7586 ◽  
Author(s):  
Le Van Lich ◽  
Van-Hai Dinh
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Field ◽  
Field Model ◽  
Phase Field Model ◽  
Ferroelectric Thin Film ◽  
Ferroelectric Thin Films ◽  
Switching Mechanism ◽  
New Phase

New phase field model to reveal switching mechanism of needle domain in compositionally graded ferroelectric thin film.

Phase-Field Simulation of Domain Structure Evolution in Ferroelectric Thin Films

2000 ◽  
Vol 652 ◽  
Author(s):  
Y. L. Li ◽  
S. Y. Hu ◽  
Z. K. Liu ◽  
L. Q. Chen
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Domain Wall ◽  
Domain Structure ◽  
Phase Field ◽  
Field Model ◽  
Phase Field Model ◽  
Ferroelectric Thin Films ◽  
Structure Evolution ◽  
Field Simulation

ABSTRACTA phase-field model for predicting the domain structure evolution in constrained ferroelectric thin films is developed. It employs an analytical elastic solution derived for a constrained film with arbitrary eigenstrain distributions. In particular, the model is applied to the domain structure evolution during a cubic→tetragonal proper ferro- electric phase transition. The effect of substrate constraint on the volume fractions of domain variants, domain-wall orientations, and domain shapes is studied. It is shown that the predicted results agree very well with existing experimental observations in ferroelectric thin films.

Phase-field model of domain structures in ferroelectric thin films

2001 ◽  
Vol 78 (24) ◽  
pp. 3878-3880 ◽  
Author(s):  
Y. L. Li ◽  
S. Y. Hu ◽  
Z. K. Liu ◽  
L. Q. Chen
Keyword(s):  
Thin Films ◽  
Phase Field ◽  
Field Model ◽  
Phase Field Model ◽  
Ferroelectric Thin Films ◽  
Domain Structures

scholarly journals A phase-field model for the evaporation of thin film mixtures

2020 ◽  
Vol 22 (12) ◽  
pp. 6638-6652 ◽  
Author(s):  
Olivier J. J. Ronsin ◽  
DongJu Jang ◽  
Hans-Joachim Egelhaaf ◽  
Christoph J. Brabec ◽  
Jens Harting
Keyword(s):  
Thin Film ◽  
Structure Formation ◽  
Phase Field ◽  
Field Model ◽  
Phase Field Model ◽  
Immiscible Blend

Simulation of the structure formation of an immiscible blend upon fast drying including roughness generation.

CRITICAL BEHAVIOUR OF FERROELECTRIC THIN FILMS

2002 ◽  
Vol 16 (03) ◽  
pp. 473-480 ◽  
Author(s):  
JULIA M. WESSELINOWA ◽  
STEFFEN TRIMPER
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Scaling Laws ◽  
Transverse Field ◽  
Ferroelectric Thin Film ◽  
Ferroelectric Thin Films ◽  
Number Of Layers ◽  
Ising Systems ◽  
2D And 3D ◽  
Good Agreement

Based on an Ising model in a transverse field (TIM) and using a Green's function formalism the critical exponents of the polarization β and of the longitudinal susceptibility γ are calculated for a ferroelectric thin film consisting of N layers. The exponents depends on the number of layers in a significant manner. Whereas for N=3 layers the exponents are β=0.131 and γ=1.739 there is a change over to β=0.315 and γ=1.239 in case of N=30. The datas are in a good agreement with predictions for 2D and 3D Ising systems. Using scaling laws other exponents like α, δ, η and ν are obtained, too.

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