Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy

B. Kaczer; H.-J. Im; J. P. Pelz; R. M. Wallace

doi:10.1063/1.122310

Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy

Applied Physics Letters ◽

10.1063/1.122310 ◽

1998 ◽

Vol 73 (13) ◽

pp. 1871-1873 ◽

Cited By ~ 4

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

R. M. Wallace

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Sio2 Films ◽

Ballistic Electron ◽

Emission Microscopy

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Erratum: “Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy” [Appl. Phys. Lett. 73, 1871 (1998)]

Applied Physics Letters ◽

10.1063/1.123041 ◽

1999 ◽

Vol 74 (3) ◽

pp. 478-478

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

R. M. Wallace

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Sio2 Films ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-electron scattering at Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

Applied Surface Science ◽

10.1016/s0169-4332(96)00215-2 ◽

1996 ◽

Vol 104-105 ◽

pp. 274-281 ◽

Cited By ~ 9

Author(s):

C.A. Ventrice ◽

V.P. LaBella ◽

G. Ramaswamy ◽

H.-P. Yu ◽

L.J. Schowalter

Keyword(s):

Electron Scattering ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Temperature Dependent ◽

Ballistic Electron ◽

Emission Microscopy

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Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy

IBM Journal of Research and Development ◽

10.1147/rd.444.0517 ◽

2000 ◽

Vol 44 (4) ◽

pp. 517-534 ◽

Cited By ~ 16

Author(s):

R. Ludeke

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Oxide Degradation ◽

Emission Microscopy ◽

Mos Structures ◽

Electron Effects

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Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission

Applied Physics Letters ◽

10.1063/1.2757150 ◽

2007 ◽

Vol 91 (4) ◽

pp. 042901 ◽

Cited By ~ 8

Author(s):

W. Cai ◽

S. E. Stone ◽

J. P. Pelz ◽

L. F. Edge ◽

D. G. Schlom

Keyword(s):

Electron Transport ◽

Conduction Band ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Internal Photoemission ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Atomic and mesoscopic scale characterization of semiconductor interfaces by ballistic electron emission microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580588 ◽

1997 ◽

Vol 15 (3) ◽

pp. 1351-1357 ◽

Cited By ~ 9

Author(s):

E. Y. Lee ◽

S. Bhargava ◽

M. A. Chin ◽

V. Narayanamurti

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Mesoscopic Scale ◽

Ballistic Electron ◽

Semiconductor Interfaces ◽

Emission Microscopy ◽

Scale Characterization

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Measuring spin dependent hot electron transport through a metal-semiconductor interface using spin-polarized ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.76.195311 ◽

2007 ◽

Vol 76 (19) ◽

Cited By ~ 3

Author(s):

A. J. Stollenwerk ◽

M. R. Krause ◽

J. J. Garramone ◽

E. J. Spadafora ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Semiconductor Interface ◽

Ballistic Electron ◽

Spin Polarized ◽

Emission Microscopy ◽

Hot Electron Transport

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Avalanche ballistic electron emission microscopy with single hot-electron sensitivity

Applied Physics Letters ◽

10.1063/1.1613996 ◽

2003 ◽

Vol 83 (14) ◽

pp. 2841-2843 ◽

Cited By ~ 1

Author(s):

E. R. Heller ◽

C. Tivarus ◽

J. P. Pelz

Keyword(s):

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Characterization of Individual Threading Dislocations in GaN Using Ballistic Electron Emission Microscopy

Physical Review Letters ◽

10.1103/physrevlett.87.106802 ◽

2001 ◽

Vol 87 (10) ◽

Cited By ~ 30

Author(s):

H.-J. Im ◽

Y. Ding ◽

J. P. Pelz ◽

B. Heying ◽

J. S. Speck

Keyword(s):

Electron Emission ◽

Threading Dislocations ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.3136761 ◽

2009 ◽

Vol 27 (4) ◽

pp. 2044 ◽

Cited By ~ 10

Author(s):

J. J. Garramone ◽

J. R. Abel ◽

I. L. Sitnitsky ◽

R. L. Moore ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Transport Studies ◽

Emission Microscopy ◽

Hot Electron Transport

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Characterization of nanopipes/dislocations in silicon carbide using ballistic electron emission microscopy

Journal of Applied Physics ◽

10.1063/1.1365938 ◽

2001 ◽

Vol 89 (10) ◽

pp. 5797-5799 ◽

Cited By ~ 1

Author(s):

C. V. Reddy ◽

V. Narayanamurti

Keyword(s):

Silicon Carbide ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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