scholarly journals Development of an in-line X-ray reflectivity technique for metal film thickness measurement

2001 ◽  
Author(s):  
D. Windover
Keyword(s):  
Film Thickness ◽  
Metal Film ◽  
Thickness Measurement ◽  
X Ray ◽  
Film Thickness Measurement

scholarly journals Nanometric Metal-Film Thickness Measurement Based on a Planar Spiral Coils Stack

2015 ◽  
Vol 14 (2) ◽  
pp. 297-303 ◽  
Author(s):  
Carolina Vargas-Estevez ◽  
Roberto R. Robaina ◽  
Rafael Perez del Real ◽  
Jose A. Plaza
Keyword(s):  
Film Thickness ◽  
Metal Film ◽  
Thickness Measurement ◽  
Spiral Coils ◽  
Film Thickness Measurement

Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays

1968 ◽  
Vol 12 ◽  
pp. 446-456 ◽  
Author(s):  
Toshio Shiraiwa ◽  
Nobukatsu Fujino
Keyword(s):  
Film Thickness ◽  
Coating Thickness ◽  
Thickness Measurement ◽  
Enhancement Effect ◽  
X Rays ◽  
Ray Method ◽  
X Ray ◽  
Coating Thickness Measurement ◽  
Film Thickness Measurement ◽  
Theoretical Results

AbstractThe fluorescence x-ray method of the coating thickness measurement is theoretically studied. The theoretical formulas of the fluorescence x-ray intensity from the coating and from the substrate are obtained which include the enhancement effect between the coating and the substrate. The formulas are applied to the following examples and are confirmed experimentally: zinc on steel; tin on steel; aluminum on steel and on PMMA. The experimental results agree well with the theoretical results.

Some Observations of the Relationship Between Film Thickness and Load in High Hertz Pressure Sliding Elastohydrodynamic Contacts

1973 ◽  
Vol 95 (3) ◽  
pp. 386-390 ◽  
Author(s):  
D. Lee ◽  
D. M. Sanborn ◽  
W. O. Winer
Keyword(s):  
Film Thickness ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Independent Study ◽  
Center Line ◽  
X Ray ◽  
Transmission Technique ◽  
Minimum Film Thickness ◽  
Film Thickness Measurement ◽  
The Relationship

The dependence of film thickness on Hertz pressure at pressure levels typical of design applications has been investigated. The data presented by investigators at NASA and Battelle using an X-ray transmission technique showing a dependence much greater than that indicated by commonly accepted theories are substantiated by an independent study using an optical interference film thickness measurement technique. It is also shown that the minimum film thickness is influenced to a much greater extent by the Hertz pressure than the center line film thickness.

Nanoscale film thickness measurement based on weak measurement

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou
Keyword(s):  
Film Thickness ◽  
Thickness Measurement ◽  
Weak Measurement ◽  
Film Thickness Measurement
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