Nanoscale film thickness measurement based on weak measurement

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou
MTZ worldwide ◽  
2021 ◽  
Vol 83 (1) ◽  
pp. 28-37
Author(s):  
Henry Brunskill ◽  
Andrew Hunter ◽  
Hosung Nam ◽  
Junsik Park

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