Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers

2000 ◽  
Vol 71 (8) ◽  
pp. 3118-3122 ◽  
Author(s):  
T. Held ◽  
S. Emonin ◽  
O. Marti ◽  
O. Hollricher
Keyword(s):  
High Resolution ◽  
Optical Fibers ◽  
Near Field ◽  
Optical Microscope

High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope

2000 ◽  
Vol 39 (Part 1, No. 6A) ◽  
pp. 3599-3602 ◽  
Author(s):  
Toshiyasu Tadokoro ◽  
Toshiharu Saiki ◽  
Keiichiro Yusu ◽  
Katsutaro Ichihara
Keyword(s):  
High Resolution ◽  
Phase Change ◽  
Near Field ◽  
Optical Microscope

Extending the Possibilities of Near-Field Scanning Optical Microscopy for Simultaneous Topographical and Chemical Force Imaging

1999 ◽  
Vol 584 ◽  
Author(s):  
N. Nagy ◽  
M. C. Goh
Keyword(s):  
Optical Fiber ◽  
Optical Fibers ◽  
Microcontact Printing ◽  
Near Field ◽  
Optical Microscope ◽  
Optical Probe ◽  
Germanium Dioxide ◽  
Fiber Optic Probe ◽  
Pure Silica ◽  
Near Field Scanning

AbstractThe Near-field Scanning Optical Microscope (NSOM) is an innovative new form of surface microscopy, which can be used to obtain local spectroscopic information about surfaces, enabling the characterization of nanometer-sized regions. The most important component of this instrument is the scanning probe tip. In this paper, we discuss the production of a novel fiber optic probe that can be used in local spectroscopy with an NSOM, but also for simultaneous imaging of topography and chemical forces. The probe consists of a bent, tapered silicon dioxide optical fiber. We have determined the rates of selective wet chemical etching of germanium dioxide doped pure silica optical fibers and used this information to optimize the probe etching process. A systematic approach for the development and testing of such probes is presented. The performance of the optical probes was characterized using surfaces prepared by the technique of microcontact printing. Phase and friction images of these surfaces were obtained using both standard atomic force microscopy tips and the optical fiber probe. The new optical probe was capable of distinguishing between different chemical regions on the patterned surface.

SNOM Probe Based on Nano-Antenna with Large Aperture and High Resolution

2011 ◽  
Vol 239-242 ◽  
pp. 2863-2866
Author(s):  
Jian Ping Shi ◽  
Ke Xiu Dong ◽  
Song Lin Wen ◽  
Ling Li Zhan ◽  
Hong Jian Liu
Keyword(s):  
High Resolution ◽  
Near Field ◽  
Optical Microscope ◽  
The Novel ◽  
Incident Wavelength ◽  
Large Aperture

We present a probe of scanning near-field optical microscope (SNOM) with large aperture and high resolution, which is added a metallic dipole nano-antenna onto the tip of the ordinary probe. Based on the FDTD algorithm we investigate numerically the measure results by different aperture probes for the same sample with the incident wavelength of 830nm and the scan height of 10nm. The results show that the resolution of the new probe is 100nm, 75nm, 50 nm, 45 nm, 50 nm, 70nm when the probe aperture is 50nm, 100nm, 130nm, 150nm, 170nm, 200nm respectively, and for the ordinary probe the resolution is 50nm，120 nm,140 nm,180 nm, 200nm, 220nm correspondingly. That is to say the resolution of the ordinary probe decrease rapidly with the increasing of the aperture, however the novel probe can maintain the high resolution.

Chemical Etching Tip Processing for Magneto-Optical Scanning Near-Field Optical Microscopy

2005 ◽  
Vol 11 (S03) ◽  
pp. 18-21 ◽  
Author(s):  
J. Schoenmaker ◽  
M. Pojar ◽  
A. D. Barra-Barrera ◽  
A. C. Seabra ◽  
A. D. Santos
Keyword(s):  
Optical Fibers ◽  
Exchange Bias ◽  
Chemical Etching ◽  
Near Field ◽  
Optical Microscope ◽  
Magnetic Multilayers ◽  
Optical Scanning ◽  
Reliable Instrument ◽  
Microscopy Characterization

Nanoscale resolution in microscopy characterization has become crucial for state-of-the-art science and technology. We have developed a Magneto-optical Scanning Near-Field Optical Microscope (MO-SNOM), and it has demonstrated to be a powerful tool to study local magnetic properties [1,2]. One of the critical steps in producing a reliable instrument and consistent images is the fabrication of the microscope tip. This work presents concepts and results on tip processing by chemical etching on FS-SN-3224 optical fibers from 3M. The quality of the tips produced was tested on magnetic multilayers presenting exchange-bias coupling.

High resolution and high sensitivity near-field optical microscope

2000 ◽  
Vol 53 (1-4) ◽  
pp. 653-656 ◽  
Author(s):  
J.M. Freyland ◽  
R. Eckert ◽  
H. Heinzelmann
Keyword(s):  
High Resolution ◽  
Near Field ◽  
High Sensitivity ◽  
Optical Microscope

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

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