Application to dielectric, metallic, and magnetic samples of a transmission mode scanning near field optical microscope with normal force distance regulation on bent optical fibers

1999 ◽  
Vol 70 (12) ◽  
pp. 4587-4594 ◽  
Author(s):  
T. David ◽  
C. Chicanne ◽  
N. Richard ◽  
J. R. Krenn ◽  
F. Scheurer ◽  
...  
Keyword(s):  
Optical Fibers ◽  
Normal Force ◽  
Near Field ◽  
Optical Microscope ◽  
Transmission Mode ◽  
Distance Regulation

A near‐field optical microscope with normal force distance regulation

1996 ◽  
Vol 67 (11) ◽  
pp. 3891-3897 ◽  
Author(s):  
R. J. Stephenson ◽  
S. J. O’Shea ◽  
J. R. Barnes ◽  
T. Rayment ◽  
M. E. Welland
Keyword(s):  
Normal Force ◽  
Near Field ◽  
Optical Microscope ◽  
Distance Regulation

Extending the Possibilities of Near-Field Scanning Optical Microscopy for Simultaneous Topographical and Chemical Force Imaging

1999 ◽  
Vol 584 ◽  
Author(s):  
N. Nagy ◽  
M. C. Goh
Keyword(s):  
Optical Fiber ◽  
Optical Fibers ◽  
Microcontact Printing ◽  
Near Field ◽  
Optical Microscope ◽  
Optical Probe ◽  
Germanium Dioxide ◽  
Fiber Optic Probe ◽  
Pure Silica ◽  
Near Field Scanning

AbstractThe Near-field Scanning Optical Microscope (NSOM) is an innovative new form of surface microscopy, which can be used to obtain local spectroscopic information about surfaces, enabling the characterization of nanometer-sized regions. The most important component of this instrument is the scanning probe tip. In this paper, we discuss the production of a novel fiber optic probe that can be used in local spectroscopy with an NSOM, but also for simultaneous imaging of topography and chemical forces. The probe consists of a bent, tapered silicon dioxide optical fiber. We have determined the rates of selective wet chemical etching of germanium dioxide doped pure silica optical fibers and used this information to optimize the probe etching process. A systematic approach for the development and testing of such probes is presented. The performance of the optical probes was characterized using surfaces prepared by the technique of microcontact printing. Phase and friction images of these surfaces were obtained using both standard atomic force microscopy tips and the optical fiber probe. The new optical probe was capable of distinguishing between different chemical regions on the patterned surface.

Chemical Etching Tip Processing for Magneto-Optical Scanning Near-Field Optical Microscopy

2005 ◽  
Vol 11 (S03) ◽  
pp. 18-21 ◽  
Author(s):  
J. Schoenmaker ◽  
M. Pojar ◽  
A. D. Barra-Barrera ◽  
A. C. Seabra ◽  
A. D. Santos
Keyword(s):  
Optical Fibers ◽  
Exchange Bias ◽  
Chemical Etching ◽  
Near Field ◽  
Optical Microscope ◽  
Magnetic Multilayers ◽  
Optical Scanning ◽  
Reliable Instrument ◽  
Microscopy Characterization

Nanoscale resolution in microscopy characterization has become crucial for state-of-the-art science and technology. We have developed a Magneto-optical Scanning Near-Field Optical Microscope (MO-SNOM), and it has demonstrated to be a powerful tool to study local magnetic properties [1,2]. One of the critical steps in producing a reliable instrument and consistent images is the fabrication of the microscope tip. This work presents concepts and results on tip processing by chemical etching on FS-SN-3224 optical fibers from 3M. The quality of the tips produced was tested on magnetic multilayers presenting exchange-bias coupling.

Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers

2000 ◽  
Vol 71 (8) ◽  
pp. 3118-3122 ◽  
Author(s):  
T. Held ◽  
S. Emonin ◽  
O. Marti ◽  
O. Hollricher
Keyword(s):  
High Resolution ◽  
Optical Fibers ◽  
Near Field ◽  
Optical Microscope

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

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