A horizontal-type scanning near-field optical microscope with torsional mode operation toward high-resolution and non-destructive imaging of soft materials

2020 ◽  
Vol 91 (7) ◽  
pp. 073703
Author(s):  
Jia-Ru Yu ◽  
He-Chun Chou ◽  
Chih-Wen Yang ◽  
Wei-Ssu Liao ◽  
Ing-Shouh Hwang ◽  
...  
Keyword(s):  
High Resolution ◽  
Near Field ◽  
Soft Materials ◽  
Optical Microscope ◽  
Torsional Mode ◽  
Mode Operation ◽  
Horizontal Type ◽  
Non Destructive

scholarly journals A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging

Sensors ◽  
2020 ◽  
Vol 20 (9) ◽  
pp. 2670
Author(s):  
Zipeng Xie ◽  
Yongjie Li ◽  
Liguo Sun ◽  
Wentao Wu ◽  
Rui Cao ◽  
...  
Keyword(s):  
High Resolution ◽  
Dielectric Material ◽  
Near Field ◽  
Skin Layer ◽  
Destructive Testing ◽  
Microwave Frequencies ◽  
Metal Materials ◽  
Microstrip Ring ◽  
Planar Circuit ◽  
Non Destructive

Non-destructive tests working at lower microwave frequencies have large advantages of dielectric material penetrability, lower equipment cost, and lower implementation complexity. However, the resolution will become worse as the work frequencies become lower. Relying on designing the structure of high field confinement, this study realizes a simple complementary spiral resonators (CSRs)-based near-field probe for microwave non-destructive testing (NDT) and imaging around 390 MHz (λ = 769 mm) whereby very high resolution (λ/308, 2.5 mm) is achieved. By applying an ingenious structure where a short microstrip is connected to a microstrip ring to feed the CSR, the probe, that is a single-port microwave planar circuit, does not need any extra matching circuits, which has more application potential in sensor arraying compared with other microwave probes. The variation of the electric field distribution with the standoff distance (SOD) between the material under test and the probe are analyzed to reveal the operation mechanisms behind the improved sensitivity and resolution of the proposed probe. Besides, the detection abilities of the tiny defects in metal and non-metal materials are demonstrated by the related experiments. The smallest detectable crack and via in the non-metal materials and the metal materials are of a λ/1538 (0.5 mm) width, a λ/513 (1.5 mm) diameter, a λ/3846 (0.2 mm) width and a λ/513 (1.5 mm) diameter, respectively. Moreover, to further evaluate the performance of the proposed probe, the defects under skin layer in the multilayer composite materials and the defects under corrosion in the carbon steel are inspected and imaged. Due to lower work frequency, high resolution, outstanding detection abilities of tiny defects, and large potentials in sensor arraying, the proposed probe would be a good candidate for microwave NDT and imaging.

High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope

2000 ◽  
Vol 39 (Part 1, No. 6A) ◽  
pp. 3599-3602 ◽  
Author(s):  
Toshiyasu Tadokoro ◽  
Toshiharu Saiki ◽  
Keiichiro Yusu ◽  
Katsutaro Ichihara
Keyword(s):  
High Resolution ◽  
Phase Change ◽  
Near Field ◽  
Optical Microscope

High-resolution Terahertz near-field reflection measurements for complementary non-destructive inspection of integrated circuits

2021 ◽  
Author(s):  
Alexander Michalski ◽  
Simon Sawallich ◽  
John True ◽  
Navid Asadizanjani ◽  
Michael Nagel
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Near Field ◽  
Non Destructive

SNOM Probe Based on Nano-Antenna with Large Aperture and High Resolution

2011 ◽  
Vol 239-242 ◽  
pp. 2863-2866
Author(s):  
Jian Ping Shi ◽  
Ke Xiu Dong ◽  
Song Lin Wen ◽  
Ling Li Zhan ◽  
Hong Jian Liu
Keyword(s):  
High Resolution ◽  
Near Field ◽  
Optical Microscope ◽  
The Novel ◽  
Incident Wavelength ◽  
Large Aperture

We present a probe of scanning near-field optical microscope (SNOM) with large aperture and high resolution, which is added a metallic dipole nano-antenna onto the tip of the ordinary probe. Based on the FDTD algorithm we investigate numerically the measure results by different aperture probes for the same sample with the incident wavelength of 830nm and the scan height of 10nm. The results show that the resolution of the new probe is 100nm, 75nm, 50 nm, 45 nm, 50 nm, 70nm when the probe aperture is 50nm, 100nm, 130nm, 150nm, 170nm, 200nm respectively, and for the ordinary probe the resolution is 50nm，120 nm,140 nm,180 nm, 200nm, 220nm correspondingly. That is to say the resolution of the ordinary probe decrease rapidly with the increasing of the aperture, however the novel probe can maintain the high resolution.

High resolution and high sensitivity near-field optical microscope

2000 ◽  
Vol 53 (1-4) ◽  
pp. 653-656 ◽  
Author(s):  
J.M. Freyland ◽  
R. Eckert ◽  
H. Heinzelmann
Keyword(s):  
High Resolution ◽  
Near Field ◽  
High Sensitivity ◽  
Optical Microscope

Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers

2000 ◽  
Vol 71 (8) ◽  
pp. 3118-3122 ◽  
Author(s):  
T. Held ◽  
S. Emonin ◽  
O. Marti ◽  
O. Hollricher
Keyword(s):  
High Resolution ◽  
Optical Fibers ◽  
Near Field ◽  
Optical Microscope

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Cosmetology treatments on human hair: An SEM study

1996 ◽  
Vol 54 ◽  
pp. 940-941
Author(s):  
D.F. Bowling
Keyword(s):  
High School ◽  
High Resolution ◽  
Human Hair ◽  
Optical Microscope ◽  
Convincing Evidence ◽  
Brightness Contrast ◽  
Sem Study

High school cosmetology students study the methods and effects of various human hair treatments, including permanents, straightening, conditioning, coloring and cutting. Although they are provided with textbook examples of overtreatment and numerous hair disorders and diseases, a view of an individual hair at the high resolution offered by an SEM provides convincing evidence of the hair‘s altered structure. Magnifications up to 2000X provide dramatic differences in perspective. A good quality classroom optical microscope can be very informative at lower resolutions.Students in a cosmetology class are initially split into two groups. One group is taught basic controls on the SEM (focus, magnification, brightness, contrast, specimen X, Y, and Z axis movements). A healthy, untreated piece of hair is initially examined on the SEM The second group cements a piece of their own hair on a stub. The samples are dryed quickly using heat or vacuum while the groups trade places and activities.

New form of Transmission Cross Coefficient for High-Resolution Imaging

1990 ◽  
Vol 48 (1) ◽  
pp. 60-61
Author(s):  
Kazuo Ishizuka
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Function ◽  
Incident Beam ◽  
Optical Microscope ◽  
Strong Interactions ◽  
Small Range ◽  
Specimen Thickness ◽  
Beam Direction ◽  
Diffracted Waves

It is well known that taking into account spacial and temporal coherency of illumination as well as the wave aberration is important to interpret an image of a high-resolution electron microscope (HREM). This occues, because coherency of incident electrons restricts transmission of image information. Due to its large spherical and chromatic aberrations, the electron microscope requires higher coherency than the optical microscope. On an application of HREM for a strong scattering object, we have to estimate the contribution of the interference between the diffracted waves on an image formation. The contribution of each pair of diffracted waves may be properly represented by the transmission cross coefficients (TCC) between these waves. In this report, we will show an improved form of the TCC including second order derivatives, and compare it with the first order TCC.In the electron microscope the specimen is illuminated by quasi monochromatic electrons having a small range of illumination directions. Thus, the image intensity for each energy and each incident direction should be summed to give an intensity to be observed. However, this is a time consuming process, if the ranges of incident energy and/or illumination direction are large. To avoid this difficulty, we can use the TCC by assuming that a transmission function of the specimen does not depend on the incident beam direction. This is not always true, because dynamical scattering is important owing to strong interactions of electrons with the specimen. However, in the case of HREM, both the specimen thickness and the illumination angle should be small. Therefore we may neglect the dependency of the transmission function on the incident beam direction.

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