Design and performance of x-ray optics optimized for polycrystalline microdiffraction

2000 ◽  
Author(s):  
G. E. Ice
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
And Performance

Design and performance of graded multilayers as focusing elements for x-ray optics

1999 ◽  
Vol 70 (8) ◽  
pp. 3227-3232 ◽  
Author(s):  
Ch. Morawe ◽  
P. Pecci ◽  
J. Ch. Peffen ◽  
E. Ziegler
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
And Performance

scholarly journals Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

2000 ◽  
Vol 88 (1) ◽  
pp. 460-470 ◽  
Author(s):  
D. L. Windt ◽  
F. E. Christensen ◽  
W. W. Craig ◽  
C. Hailey ◽  
F. A. Harrison ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
Growth Structure ◽  
And Performance

scholarly journals NuSTAR hard x-ray optics design and performance

2009 ◽  
Author(s):  
Jason E. Koglin ◽  
HongJun An ◽  
Kenneth L. Blaedel ◽  
Nicolai F. Brejnholt ◽  
Finn E. Christensen ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
And Performance ◽  
Optics Design

Fabrication and performance of etched multilayer x-ray optics

1998 ◽  
Author(s):  
Zhanshan Wang ◽  
Yueying Ma ◽  
Jianlin Cao ◽  
Xingdan Chen ◽  
Xiangdong Xu ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
And Performance

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Aperiodic multilayer structures in soft X-ray optics

2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin
Keyword(s):  
Multilayer Structures ◽  
Ray Optics ◽  
X Ray

Diffraction limited X-ray optics: technology, metrology, applications

2019 ◽  
Vol 190 (01) ◽  
pp. 74-91
Author(s):  
Nikolai I. Chkhalo ◽  
Ilya V. Malyshev ◽  
Alexey E. Pestov ◽  
Vladimir N. Polkovnikov ◽  
Nikolai N. Salashchenko ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document