Role of hydrogen on field emission from chemical vapor deposited diamond and nanocrystalline diamond powder

2000 ◽  
Vol 88 (6) ◽  
pp. 3667-3673 ◽  
Author(s):  
J. B. Cui ◽  
M. Stammler ◽  
J. Ristein ◽  
L. Ley
2008 ◽  
Vol 8 (8) ◽  
pp. 4141-4145 ◽  
Author(s):  
Huang-Chin Chen ◽  
Umesh Palnitkar ◽  
Huan Niu ◽  
Hsiu-Fung Cheng ◽  
I-Nan Lin

Nanocrystalline diamond films prepared by microwave plasma enhanced chemical vapor deposition (MPECVD) were implanted using 110 keV nitrogen ions under fluence ranging from 1013–1014 ions/cm2. Scanning Electron Microscopy (SEM) and Raman spectroscopy were used to analyze the changes in the surface of the films before and after ion implantation. Results show that with nitrogen ion implantation in nanocrystalline diamond film cause to decrease in diamond crystallinity. The field emission measurement shows a sharp increase in current density with increase in dose. The ion implantation also alters the turn on field. It is observed that the structural damage caused by ion implantation plays a significant role in emission behaviour of nanocrystalline diamonds.


1998 ◽  
Vol 72 (17) ◽  
pp. 2182-2184 ◽  
Author(s):  
Paul W. May ◽  
Stefan Höhn ◽  
Wang N. Wang ◽  
Neil A. Fox

1997 ◽  
Vol 498 ◽  
Author(s):  
T. G. McCauley ◽  
T. D. Corrigan ◽  
A. R. Krauss ◽  
O. Auciello ◽  
D. Zhou ◽  
...  

ABSTRACTIn this paper, we report on a substantial lowering of the threshold field for electron field emission from Si field emitter arrays (FEA), which have been coated with a thin layer of nanocrystalline diamond by microwave plasma-assisted chemical vapor deposition (MPCVD) from fullerene (C60) and methane (CH4) precursors. The field emission characteristics were investigated and the emission sites imaged using photoelectron emission microscopy (PEEM). Electron emission from these Si FEAs coated with nanocrystalline diamond was observed at threshold fields as low as 3 V/μm, with effective work functions as low as 0.59 eV.


1998 ◽  
Vol 509 ◽  
Author(s):  
Ryuichi Matsuda ◽  
Ken Okano ◽  
Bradford B. Pate

AbstractThe kinetic energy and spatial distribution of field electron emission from nitrogen (urea) doped, chemical vapor deposited (CVD) diamond films have been examined with simultaneous field emission and photoemission. A linear Fowler-Nordheim characteristic was measured over a wide range of currents. The field emission electrons originate from distinct areas of the flat sample. The dominant origin of field emission is due to electrons tunneling from near the valence band maximum. A time dependent fluctuation in the kinetic energy and spatial distribution of the emission is observed when the applied electric field (and hence emission current density) is increased well above the emission threshold.


1998 ◽  
Vol 145 (7) ◽  
pp. 2572-2576 ◽  
Author(s):  
A. N. Obraztsov ◽  
I. Yu. Pavlovsky ◽  
A. P. Volkov ◽  
E. V. Rakova ◽  
S. P. Nagovitsyn

2001 ◽  
Vol 79 (9) ◽  
pp. 1288-1290 ◽  
Author(s):  
N. Koenigsfeld ◽  
R. Kalish ◽  
A. Cimmino ◽  
D. Hoxley ◽  
S. Prawer ◽  
...  

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