High-quality strain-relaxed SiGe alloy grown on implanted silicon–on–insulator substrate

2000 ◽  
Vol 76 (19) ◽  
pp. 2680-2682 ◽  
Author(s):  
F. Y. Huang ◽  
M. A. Chu ◽  
M. O. Tanner ◽  
K. L. Wang ◽  
G. D. U’Ren ◽  
...  
2003 ◽  
Vol 32 (11) ◽  
pp. 1339-1343 ◽  
Author(s):  
D. V. Singh ◽  
L. Shi ◽  
K. W. Guarini ◽  
P. M. Mooney ◽  
S. J. Koester ◽  
...  

Author(s):  
C. O. Jung ◽  
S. J. Krause ◽  
S.R. Wilson

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.


2021 ◽  
Vol 42 (4) ◽  
pp. 469-472
Author(s):  
Yingtao Yu ◽  
Si Chen ◽  
Qitao Hu ◽  
Paul Solomon ◽  
Zhen Zhang

1999 ◽  
Vol 75 (7) ◽  
pp. 983-985 ◽  
Author(s):  
Yukari Ishikawa ◽  
N. Shibata ◽  
S. Fukatsu

2014 ◽  
Vol 116 (7) ◽  
pp. 074513 ◽  
Author(s):  
V. Mikhelashvili ◽  
D. Cristea ◽  
B. Meyler ◽  
S. Yofis ◽  
Y. Shneider ◽  
...  

Author(s):  
Mary Gopanchuk ◽  
Mohamed Arabi ◽  
N. Nelson-Fitzpatrick ◽  
Majed S. Al-Ghamdi ◽  
Eihab Abdel-Rahman ◽  
...  

This paper reports on the design, fabrication, and characterization of non-interdigitated comb drive actuators in Silicon-on-Insulator (SOI) wafers, using a single mask surface microma-chining process. The response of the actuator is analyzed numerically and experimentally. The results show at the fundamental frequency; it behaves as a longitudinal comb drive actuator. At a higher frequency, it exhibits a high-quality factor which is appropriate for sensor applications.


2013 ◽  
Vol 49 (20) ◽  
pp. 1273-1275 ◽  
Author(s):  
B.‐K. Tan ◽  
G. Yassin ◽  
P. Grimes ◽  
K. Jacobs

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