On the long pulse operation of an x-ray preionized, gas discharge pumped ArF excimer laser

1999 ◽  
Vol 75 (8) ◽  
pp. 1033-1035 ◽  
Author(s):  
L. Feenstra ◽  
H. M. J. Bastiaens ◽  
P. J. M. Peters ◽  
W. J. Witteman
1998 ◽  
Vol 72 (22) ◽  
pp. 2791-2793 ◽  
Author(s):  
H. M. J. Bastiaens ◽  
S. J. M. Peeters ◽  
X. Renard ◽  
P. J. M. Peters ◽  
W. J. Witteman

1990 ◽  
Vol 68 (3) ◽  
pp. 1361-1363 ◽  
Author(s):  
Katsuhiko Mutoh ◽  
Yuka Yamada ◽  
Takashi Iwabuchi ◽  
Takeo Miyata

2001 ◽  
Author(s):  
Kouji Kakizaki ◽  
Takashi Matsunaga ◽  
Yoichi Sasaki ◽  
Toyoharu Inoue ◽  
Satoshi Tanaka ◽  
...  

1998 ◽  
Author(s):  
L. Feenstra ◽  
O. B. Hoekstra ◽  
Peter J. M. Peters ◽  
Wilhelmus J. Witteman

1989 ◽  
Vol 158 ◽  
Author(s):  
R. Matz ◽  
J. Meiler ◽  
D. Haarer

ABSTRACTArF excimer laser induced etching of InP in various etch gases (HBr, HCI, CI2) is discussed with regard to its spatial resolution capability. X-ray photoemission spectra and large-area etch rate measurements published before lead to fundamental understanding and interpretation of the characteristics of etched test structures. HBr and HCI require gas phase photodissociation. CI2' in contrast, has the advantage to react spontaneously.


2021 ◽  
Vol 2 (2) ◽  
pp. 116-124
Author(s):  
Masayuki Okoshi

Long pulse-repetition intervals of 100 to 500 ms of a 193 nm ArF excimer laser successfully increased the height of the photochemical micro-/nano-swelling of silicone rubber, observed with a scanning electron microscope. The effect of the interval was seen despite the heating of the silicone rubber to 80 °C during laser irradiation. The height of the micro-/nano-swelling was saturated when the laser pulse number was 300 or greater, although each of the saturated heights of the micro-/nano-swelling formed by several pulse-repetition intervals was different. Thus, a second ArF excimer laser irradiated the growing micro-/nano-swelling before the saturation; the saturated height of the growing micro-/nano-swelling could be controlled by the pulse-repetition interval of the second ArF excimer laser. To examine the process of micro-/nano-swelling, an early stage of the growth was observed using an atomic force microscope; a dent structure of the micro-/nano-swelling was clearly recognized. In addition, a needle-like structure of the micro-/nano-swelling could be formed when silica glass microspheres were sparsely aligned.


1999 ◽  
Author(s):  
Sarah Bollanti ◽  
Paolo Di Lazzaro ◽  
Francesco Flora ◽  
Tommaso Letardi ◽  
Alessandro Marinai ◽  
...  

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