Photoluminescence and photoluminescence excitation spectroscopy of Er-doped Si prepared by laser ablation

1999 ◽  
Vol 75 (1) ◽  
pp. 97-99 ◽  
Author(s):  
Wai Lek Ng ◽  
M. P. Temple ◽  
P. A. Childs ◽  
F. Wellhofer ◽  
K. P. Homewood
2006 ◽  
Vol 23 (8) ◽  
pp. 1581
Author(s):  
John W. Keto ◽  
Michael F. Becker ◽  
Desiderio Kovar ◽  
Gokul Malyavanatham ◽  
Andreas Muller ◽  
...  
Keyword(s):  
Er Doped ◽  

2004 ◽  
Vol 43 (4A) ◽  
pp. 1541-1544 ◽  
Author(s):  
Jeong Sook Ha ◽  
Young Rae Jang ◽  
Keon Ho Yoo ◽  
Chang Hyun Bae ◽  
Sang Hwan Nam ◽  
...  

2006 ◽  
Vol 84 (4) ◽  
pp. 395-401 ◽  
Author(s):  
N. Fukata ◽  
C. Li ◽  
H. Morihiro ◽  
K. Murakami ◽  
M. Mitome ◽  
...  

2004 ◽  
Vol 832 ◽  
Author(s):  
N. Fukata ◽  
C. Li ◽  
H. Uematsu ◽  
T. Arai ◽  
T. Makimura ◽  
...  

ABSTRACTHydrogen passivation effect on the enhancement of photoluminescence (PL) of Er ions in SiO2 films contained Si nanocrystallites (nc-Si) has been investigated. Er-doped SiO2 films were fabricated by laser ablation of Er-deposited Si substrate in oxygen gas atmosphere. The PL intensity of Er ions and nc-Si were increased by hydrogen gas treatments, while ESR signal intensity of residual defects located at the interfaces between nc-Si and SiO2 was decreased. These results indicate that hydrogen passivation of residual defects is useful for the enhancement of the Er PL.


1999 ◽  
Vol 85 (8) ◽  
pp. 4024-4031 ◽  
Author(s):  
Masashi Ishii ◽  
Tetsuya Ishikawa ◽  
Tatzuo Ueki ◽  
Shuji Komuro ◽  
Takitaro Morikawa ◽  
...  

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