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A normal incidence p-type strain layer quantum well infrared photodetector with 19.2 μm peak detection wavelength
Applied Physics Letters
◽
10.1063/1.122267
◽
1998
◽
Vol 73
(12)
◽
pp. 1664-1666
Author(s):
J. Chu
◽
Sheng S. Li
◽
A. Singh
◽
P. Ho
Keyword(s):
Quantum Well
◽
Type Strain
◽
Normal Incidence
◽
Peak Detection
◽
Infrared Photodetector
◽
Quantum Well Infrared Photodetector
◽
Strain Layer
◽
P Type
Download Full-text
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◽
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◽
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Normal incidence p-type strained-layer In0.3Ga0.7As/In0.52Al0.48As quantum well infrared photodetector with background limited performance at 77 K
10.1117/12.179692
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1994
◽
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◽
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◽
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◽
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Medium‐wavelength, normal‐incidence, p‐type Si/SiGe quantum well infrared photodetector with background limited performance up to 85 K
Applied Physics Letters
◽
10.1063/1.117263
◽
1996
◽
Vol 69
(22)
◽
pp. 3372-3374
◽
Cited By ~ 46
Author(s):
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◽
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◽
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◽
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◽
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◽
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Quantum Well
◽
Normal Incidence
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Growth of p-type GaAs∕AlGaAs(111) quantum well infrared photodetector using solid source molecular-beam epitaxy
Journal of Applied Physics
◽
10.1063/1.2034652
◽
2005
◽
Vol 98
(5)
◽
pp. 054905
◽
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Quantum Well
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Preliminary design of a tensile-strained p-type Si/SiGe quantum well infrared photodetector
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◽
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◽
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◽
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◽
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◽
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Quantum Well
◽
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◽
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◽
Quantum Well Infrared Photodetector
◽
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A normal incidence two‐colorp‐type compressive strained‐layer In0.4Ga0.6As/GaAs quantum well infrared photodetector for 3–5 μm and 8–12 μm detection
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◽
10.1063/1.358352
◽
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◽
Vol 76
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◽
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◽
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◽
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◽
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Normal incidence n-type GaAs/Al Ga1−As quantum well infrared photodetector
Thin Solid Films
◽
10.1016/s0040-6090(97)00589-0
◽
1998
◽
Vol 312
(1-2)
◽
pp. 265-267
Author(s):
G.L. Luo
◽
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◽
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A normal‐incidence type‐II quantum‐well infrared photodetector using an indirect AlAs/Al0.5Ga0.5As system grown on (110) GaAs for mid‐ and long‐wavelength multicolor detection
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◽
10.1063/1.354896
◽
1993
◽
Vol 74
(2)
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Growth of AlGaAs and AlGaAs/GaAs heterostructures on misoriented (110)GaAs and a normal incidence type-II AlAs/AlGaAs quantum well infrared photodetector
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
10.1116/1.586744
◽
1993
◽
Vol 11
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◽
pp. 935
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A new compressively strained‐layer p‐type InGaAs/AlGaAs/GaAs step bound to miniband quantum well infrared photodetector with a detection peak at 10.4 μm
Applied Physics Letters
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◽
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Quantum Well Infrared Photodetector
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