Electrical characterization of GaN/SiC n-p heterojunction diodes

1998 ◽  
Vol 72 (11) ◽  
pp. 1371-1373 ◽  
Author(s):  
John T. Torvik ◽  
Moeljanto Leksono ◽  
Jacques I. Pankove ◽  
Bart Van Zeghbroeck ◽  
Hock M. Ng ◽  
...  
Keyword(s):  
Electrical Characterization ◽  
Heterojunction Diodes

Fabrication and Electrical Characterization of Vacuum Deposited n-CdTe∕p-ZnTe Heterojunction Diodes

2011 ◽  
Author(s):  
Kasturi V. Bangera ◽  
Gowrish K. Rao ◽  
G. K. Shivakumar ◽  
Abdul Manaf Hashim ◽  
Vijay K. Arora
Keyword(s):  
Electrical Characterization ◽  
Heterojunction Diodes

Electrical characterization of engineered ZnSeGaAs heterojunction diodes

1997 ◽  
Vol 175-176 ◽  
pp. 603-607 ◽  
Author(s):  
Michele Lazzeri ◽  
Vittorio Pellegrini ◽  
Fabio Beltram ◽  
Marco Lazzarino ◽  
Jens J. Paggel ◽  
...  
Keyword(s):  
Electrical Characterization ◽  
Heterojunction Diodes

Electrical characterization of transparent p–i–n heterojunction diodes

2001 ◽  
Vol 90 (11) ◽  
pp. 5763-5767 ◽  
Author(s):  
R. L. Hoffman ◽  
J. F. Wager ◽  
M. K. Jayaraj ◽  
J. Tate
Keyword(s):  
Electrical Characterization ◽  
Heterojunction Diodes

Fabrication and Temperature Dependent Electrical Characterization of n-ZnO Nanowires/p-Si Substrate Heterojunction Diodes

2017 ◽  
Vol 12 (10) ◽  
pp. 1162-1166 ◽  
Author(s):  
H. Algarni ◽  
R. I. Badran ◽  
M. Ajmal Khan ◽  
Fredj Hassen ◽  
S. H. Kim ◽  
...  
Keyword(s):  
Electrical Characterization ◽  
Zno Nanowires ◽  
Si Substrate ◽  
Temperature Dependent ◽  
Heterojunction Diodes

Structural and Electrical Characterization of Shaped Beam Laser Recrystallized Polysilicon on Amorphous Substrates

1981 ◽  
Vol 4 ◽  
Author(s):  
T. J. Stultz ◽  
J. F. Gibbons
Keyword(s):  
Grain Size ◽  
Electrical Characterization ◽  
Grain Structure ◽  
Electrical Characteristics ◽  
Shaped Beam ◽  
Beam Laser ◽  
Cw Laser ◽  
Amorphous Substrates ◽  
Circular Beam

ABSTRACTStructural and electrical characterization of laser recrystallized LPCVD silicon films on amorphous substrates using a shaped cw laser beam have been performed. In comparing the results to data obtained using a circular beam, it was found that a significant increase in grain size can be achieved and that the surface morphology of the shaped beam recrystallized material was much smoother. It was also found that whereas circular beam recrystallized material has a random grain structure, shaped beam material is highly oriented with a <100> texture. Finally the electrical characteristics of the recrystallized film were very good when measured in directions parallel to the grain boundaries.

Vapor Deposition Polymerization and Electrical Characterization of TPD Thin Films

2011 ◽  
Vol E94-C (2) ◽  
pp. 157-163 ◽  
Author(s):  
Masakazu MUROYAMA ◽  
Ayako TAJIRI ◽  
Kyoko ICHIDA ◽  
Seiji YOKOKURA ◽  
Kuniaki TANAKA ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Deposition ◽  
Electrical Characterization
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