Improvement in gate oxide integrity on thin-film silicon-on-insulator substrates by lateral gettering
Keyword(s):
2014 ◽
Vol 53
(6)
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pp. 064102
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Keyword(s):
Keyword(s):
1997 ◽
Vol 36
(Part 1, No. 5A)
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pp. 2565-2570
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Keyword(s):
1998 ◽
Vol 11
(2)
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pp. 239-245