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A novel procedure for measuring the absolute current density profile of a focused gallium‐ion beam
Applied Physics Letters
◽
10.1063/1.117668
◽
1996
◽
Vol 69
(18)
◽
pp. 2764-2766
◽
Cited By ~ 15
Author(s):
J. B. Wang
◽
Y. L. Wang
Keyword(s):
Density Profile
◽
Current Density
◽
Ion Beam
◽
Current Density Profile
◽
The Absolute
Download Full-text
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References
Current density profile measurement on the Texas Experimental Tokamak using a heavy ion beam probe
Review of Scientific Instruments
◽
10.1063/1.1149185
◽
1998
◽
Vol 69
(11)
◽
pp. 3828-3834
◽
Cited By ~ 9
Author(s):
J. G. Schwelberger
◽
T. P. Crowley
◽
K. A. Connor
◽
P. M. Schoch
Keyword(s):
Density Profile
◽
Current Density
◽
Ion Beam
◽
Heavy Ion
◽
Profile Measurement
◽
Current Density Profile
◽
Heavy Ion Beam
◽
Heavy Ion Beam Probe
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Reconstructing focused ion beam current density profile by iterative simulation methodology
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
◽
10.1116/1.4968537
◽
2016
◽
Vol 34
(6)
◽
pp. 06KO01
◽
Cited By ~ 1
Author(s):
Eddie Chang
◽
Kevin Toula
◽
Valery Ray
Keyword(s):
Density Profile
◽
Current Density
◽
Focused Ion Beam
◽
Ion Beam
◽
Beam Current
◽
Beam Current Density
◽
Simulation Methodology
◽
Current Density Profile
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Amending the uniformity of ion beam current density profile
10.1117/12.757750
◽
2007
◽
Author(s):
Xiaowei Zhou
◽
Dequan Xu
◽
Ying Liu
◽
Xiangdong Xu
◽
Shaojun Fu
Keyword(s):
Density Profile
◽
Current Density
◽
Ion Beam
◽
Beam Current
◽
Beam Current Density
◽
Current Density Profile
Download Full-text
New characterization method of ion current-density profile based on damage distribution of Ga+ focused-ion beam implantation in GaAs
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
10.1116/1.586998
◽
1993
◽
Vol 11
(6)
◽
pp. 2420
◽
Cited By ~ 41
Author(s):
G. Ben Assayag
Keyword(s):
Density Profile
◽
Current Density
◽
Focused Ion Beam
◽
Ion Beam
◽
Ion Current
◽
Damage Distribution
◽
Current Density Profile
◽
Ion Beam Implantation
◽
Ion Current Density
Download Full-text
Current density profile characterization and analysis method for focused ion beam
Microelectronic Engineering
◽
10.1016/j.mee.2016.01.016
◽
2016
◽
Vol 155
◽
pp. 19-24
◽
Cited By ~ 12
Author(s):
Yuval Greenzweig
◽
Yariv Drezner
◽
Shida Tan
◽
Richard H. Livengood
◽
Amir Raveh
Keyword(s):
Density Profile
◽
Current Density
◽
Focused Ion Beam
◽
Ion Beam
◽
Analysis Method
◽
Current Density Profile
Download Full-text
Effect of Current Density Profile onq(a) Limit in Non-Circular Tokamak TNT-A
Journal of the Physical Society of Japan
◽
10.1143/jpsj.54.1823
◽
1985
◽
Vol 54
(5)
◽
pp. 1823-1829
Author(s):
Katsumi Ida
◽
Isao Ochiai
◽
Shunjiro Shinohara
◽
Yoshio Nagayama
◽
Hiroshi Toyama
◽
...
Keyword(s):
Density Profile
◽
Current Density
◽
Current Density Profile
Download Full-text
Measurement of the Current-Density Profile and Plasma Dynamics in the Reversed-Field Pinch
Physical Review Letters
◽
10.1103/physrevlett.88.185005
◽
2002
◽
Vol 88
(18)
◽
Cited By ~ 39
Author(s):
D. L. Brower
◽
W. X. Ding
◽
S. D. Terry
◽
J. K. Anderson
◽
T. M. Biewer
◽
...
Keyword(s):
Density Profile
◽
Current Density
◽
Reversed Field Pinch
◽
Plasma Dynamics
◽
Current Density Profile
◽
Reversed Field
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Analysis of plasma equilibrium based on orbit-driven current density profile in steady-state plasma on QUEST
Fusion Engineering and Design
◽
10.1016/j.fusengdes.2015.11.035
◽
2016
◽
Vol 109-111
◽
pp. 1528-1533
◽
Cited By ~ 1
Author(s):
K. Nakamura
◽
M.M. Alam
◽
Y.Z. Jiang
◽
O. Mitarai
◽
K. Kurihara
◽
...
Keyword(s):
Steady State
◽
Density Profile
◽
Current Density
◽
Plasma Equilibrium
◽
Current Density Profile
◽
State Plasma
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Diagnostic of the current density profile in the vicinity of q = 1: The Hαemission of ablated pellets
Nuclear Fusion
◽
10.1088/0029-5515/30/8/014
◽
1990
◽
Vol 30
(8)
◽
pp. 1575-1584
◽
Cited By ~ 13
Author(s):
B. Pégourié
◽
M.A. Dubois
Keyword(s):
Density Profile
◽
Current Density
◽
Current Density Profile
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Current density profile extraction of focused ion beams based on atomic force microscopy contour profiling of nanodots
Journal of Applied Physics
◽
10.1063/1.1505685
◽
2002
◽
Vol 92
(7)
◽
pp. 4037-4042
◽
Cited By ~ 49
Author(s):
A. Lugstein
◽
B. Basnar
◽
G. Hobler
◽
E. Bertagnolli
Keyword(s):
Atomic Force Microscopy
◽
Density Profile
◽
Current Density
◽
Ion Beams
◽
Focused Ion Beams
◽
Force Microscopy
◽
Atomic Force
◽
Current Density Profile
Download Full-text
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