Dominance of tunneling current and band filling in InGaN/AlGaN double heterostructure blue light‐emitting diodes

1996 ◽  
Vol 68 (20) ◽  
pp. 2867-2869 ◽  
Author(s):  
H. C. Casey ◽  
J. Muth ◽  
S. Krishnankutty ◽  
J. M. Zavada
1997 ◽  
Vol 468 ◽  
Author(s):  
K. Yang ◽  
H. T. Shi ◽  
B. Shen ◽  
R. Zhang ◽  
Z. Z. Chen ◽  
...  

ABSTRACTIn this paper, we studied the electrical and optical characteristics of Nichia double heterostructure blue light-emitting diodes, with In0.06Ga0.94N:Zn, Si active layer, at 77 and 300 K. Measurement of the forward bias current-voltage behavior of the device demonstrates a departure from the Shockley model of p-n diodes, and it is observed that the dominant mechanism of carrier transport across the junction is associated with carrier tunneling. Electroluminescence experiments of the devices were performed. We obtained an emission peak located at 2.80 eV, and a relatively weaker short-wavelength peak of 3.2 eV. A significant blue shifts of the optical emission peak which is consistent with the tunneling character of electrical characteristics was observed. Furthermore, we studied the properties of electroluminescence under various pulsed currents, and a degradation in I-V characteristics and a low resistance ohmic short were observed.


1993 ◽  
Vol 32 (Part 2, No.1A/B) ◽  
pp. L8-L11 ◽  
Author(s):  
Shuji Nakamura ◽  
Masayuki Senoh ◽  
Takashi Mukai

1996 ◽  
Vol 69 (12) ◽  
pp. 1680-1682 ◽  
Author(s):  
Piotr Perlin ◽  
Marek Osiński ◽  
Petr G. Eliseev ◽  
Vladimir A. Smagley ◽  
Jian Mu ◽  
...  

1997 ◽  
Vol 26 (3) ◽  
pp. 311-319 ◽  
Author(s):  
Petr G. Eliseev ◽  
Piotr Perlin ◽  
Julien Furioli ◽  
Philippe Sartori ◽  
Jian Mu ◽  
...  

2013 ◽  
Vol 380-384 ◽  
pp. 3035-3038 ◽  
Author(s):  
Ren Jian ◽  
Li Sha Li ◽  
Da Wei Yan ◽  
Xiao Feng Gu

By measuring the current-voltage (I-V) characteristics in the temperature range of 100 K to 300 K, mechanisms of the forward tunneling current and the reverse leakage current of GaN-based blue light emitting diodes are analyzed. For the forward current, both the temperature-independent current slope and an ideality factor larger than 2 are typical features of the defect-assisted tunneling mechanism. For the reverse leakage current, the linear relationship between I and (V+Vbi)1/2 indicates a hopping conduction mechanism at low bias, while the power law I-V relationship suggests that the space charge limited current dominates the reverse leakage current at high bias.


2010 ◽  
Vol 96 (8) ◽  
pp. 083504 ◽  
Author(s):  
Dawei Yan ◽  
Hai Lu ◽  
Dunjun Chen ◽  
Rong Zhang ◽  
Youdou Zheng

2001 ◽  
Vol 18 (2) ◽  
pp. 283-285 ◽  
Author(s):  
Shen Bo ◽  
Shi Hong-Tao ◽  
Zhang Rong ◽  
Chen Zhi-Zhong ◽  
Zheng You-Dou

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