The role of vertical quantum wells in carrier trapping in v‐groove quantum wire lasers

1996 ◽  
Vol 68 (15) ◽  
pp. 2061-2063 ◽  
Author(s):  
C. Kiener ◽  
L. Rota ◽  
A. C. Maciel ◽  
J. M. Freyland ◽  
J. F. Ryan
2001 ◽  
Vol 680 ◽  
Author(s):  
A. Bonfiglio ◽  
G. Traetta ◽  
M. Lomascolo ◽  
A. Passaseo ◽  
R. Cingolani

ABSTRACTPhotoCurrent (PC) experiments on GaN/AlGaN multiple quantum wells, both spectrally and temporally resolved, have shown that a photopersistence effect exists in our samples even at room temperature. A peak in the rise and decay times of PC vs. time appears in correspondence of wavelengths typical of Yellow-Band features while this is not seen in PL. This fact seems to indicate that YB defects give rise here to carrier trapping rather than recombination. Furthermore, the observed persistence times seem to be peculiar of MultiQuantum Wells and this possibly calls into play the role of built-in fields in the defects dynamics.


2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Agata Bojarska-Cieślińska ◽  
Łucja Marona ◽  
Julita Smalc-Koziorowska ◽  
Szymon Grzanka ◽  
Jan Weyher ◽  
...  

AbstractIn this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial process. All structures were produced by metalorganic vapour phase epitaxy and emit light in the range 383–477 nm. We observe that intensity of electroluminescence is strong in the whole spectral region for devices grown on GaN, but decreases rapidly for the devices on sapphire and emitting at wavelength shorter than 420 nm. We interpret this behaviour in terms of increasing importance of dislocation related nonradiative recombination for low indium content structures. Our studies show that edge dislocations are the main source of nonradiative recombination. We observe that long wavelength emitting structures are characterized by higher average light intensity in cathodoluminescence and better thermal stability. These findings indicate that diffusion path of carriers in these samples is shorter, limiting the amount of carriers reaching nonradiative recombination centers. According to TEM images only mixed dislocations open into the V-pits, usually above the multi quantum wells thus not influencing directly the emission.


2021 ◽  
Vol 13 (6) ◽  
pp. 7476-7484
Author(s):  
Julita Smalc-Koziorowska ◽  
Ewa Grzanka ◽  
Artur Lachowski ◽  
Roman Hrytsak ◽  
Mikolaj Grabowski ◽  
...  

2001 ◽  
Vol 16 (8) ◽  
pp. 724-732 ◽  
Author(s):  
X Chen ◽  
M P Earnshaw ◽  
W Batty ◽  
D W E Allsopp
Keyword(s):  

2001 ◽  
Vol 90 (10) ◽  
pp. 5438-5440 ◽  
Author(s):  
X. Q. Liu ◽  
A. Sasaki ◽  
N. Ohno ◽  
Z. F. Li ◽  
W. Lu ◽  
...  

2012 ◽  
Vol 112 (12) ◽  
pp. 123105 ◽  
Author(s):  
L. Lever ◽  
Z. Ikonić ◽  
A. Valavanis ◽  
R. W. Kelsall ◽  
M. Myronov ◽  
...  

2020 ◽  
Vol 116 (4) ◽  
pp. 049901
Author(s):  
Samuel F. Neyens ◽  
Ryan H. Foote ◽  
Brandur Thorgrimsson ◽  
T. J. Knapp ◽  
Thomas McJunkin ◽  
...  

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