High‐resolution temperature measurement of void dynamics induced by electromigration in aluminum metallization

1995 ◽  
Vol 67 (11) ◽  
pp. 1606-1608 ◽  
Author(s):  
Seiichi Kondo ◽  
Kenji Hinode
1966 ◽  
Vol 5 (10) ◽  
pp. 970-973 ◽  
Author(s):  
Kenro Miyamoto ◽  
Masamoto Otsuka ◽  
Junji Fujita ◽  
Sunao Kawasaki ◽  
Nobuyuki Inoue ◽  
...  

2019 ◽  
Vol 27 (11) ◽  
pp. 2315-2320
Author(s):  
黄 良 HUANG Liang ◽  
李明轩 LI Ming-xuan ◽  
吕恒毅 L Heng-yi ◽  
李祥之 LI Xiang-zhi ◽  
韩诚山 HAN Cheng-shan

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