Thickness and effective electron mass measurements for thin silicon dioxide films using tunneling current oscillations
Keyword(s):
1987 ◽
Vol 48
(C5)
◽
pp. C5-207-C5-210
Keyword(s):
2018 ◽
Vol 18
(4)
◽
pp. 2856-2874
Keyword(s):
1989 ◽
Vol 151
(2)
◽
pp. K135-K140
◽
1962 ◽
Vol 109
(3)
◽
pp. 221
◽
Keyword(s):