Ultrahigh vacuum manipulator for sample rotation in secondary ion mass spectrometry depth profile analysis

1995 ◽  
Vol 66 (9) ◽  
pp. 4713-4715 ◽  
Author(s):  
Piotr Konarski
Keyword(s):  
Mass Spectrometry ◽  
Depth Profile ◽  
Secondary Ion Mass Spectrometry ◽  
Profile Analysis ◽  
Ultrahigh Vacuum ◽  
Depth Profile Analysis ◽  
Sample Rotation ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Dating of Obsidian Tools by Water Diffusion (SIMS-SS) with a Novel Software

2020 ◽  
Vol 13 ◽  
pp. 234
Author(s):  
I. Liritzis ◽  
T. Ganetsos ◽  
N. Laskaris
Keyword(s):  
Mass Spectrometry ◽  
Diffusion Process ◽  
Depth Profile ◽  
Secondary Ion Mass Spectrometry ◽  
Environmental Water ◽  
Water Diffusion ◽  
Asia Minor ◽  
One Dimensional ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Diffusion of environmental water into the surface of obsidian tools of archaeological origin is monitored by secondary ion mass spectrometry (SIMS), which provides a H+ concentration (C) versus hydration depth profile. The modeling of this diffusion process, as one-dimensional phenomena, is based on the idea that a saturated surface (SS) layer is encountered near the surface. A novel software program has been developed, using MATLAB, incorporating all numerical parameters for the dating of hydrated obsidians using the SIMS profile. This approach has been applied to several archaeological obsidians from the Aegean, Hungary, and Asia Minor and compared with samples from radiocarbon dated cultural phases where the agreement is excellent.

scholarly journals New Approach for Improvement of Secondary Ion Mass Spectrometry Profile Analysis

2007 ◽  
Vol 46 (11) ◽  
pp. 7441-7445 ◽  
Author(s):  
M'hamed Boulakroune ◽  
Ahmed El Oualkadi ◽  
Djamel Benatia ◽  
Tahar Kezai
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Profile Analysis ◽  
New Approach ◽  
Ion Mass Spectrometry ◽  
Mass Spectrometry Profile ◽  
Secondary Ion

scholarly journals 3D Depth Profile Reconstruction of Segregated Impurities using Secondary Ion Mass Spectrometry

10.3791/61065 ◽  
2020 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Sebastian Zlotnik ◽  
Iwona Jóźwik ◽  
Adrianna Chamryga ◽  
Mariusz Rudziński
Keyword(s):  
Mass Spectrometry ◽  
Depth Profile ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Profile Reconstruction ◽  
Secondary Ion
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