A new high‐resolution two‐dimensional micropositioning device for scanning probe microscopy applications

A. R. Smith; S. Gwo; C. K. Shih

doi:10.1063/1.1144552

A new high‐resolution two‐dimensional micropositioning device for scanning probe microscopy applications

Review of Scientific Instruments ◽

10.1063/1.1144552 ◽

1994 ◽

Vol 65 (10) ◽

pp. 3216-3219 ◽

Cited By ~ 27

Author(s):

A. R. Smith ◽

S. Gwo ◽

C. K. Shih

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Two Dimensional ◽

Probe Microscopy

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Progress in High-resolution Scanning Probe Microscopy

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85228-5_2 ◽

2008 ◽

pp. 3-4

Author(s):

A. Engel ◽

P. Bosshart ◽

P. Frederix ◽

S. A. Müller

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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High resolution acoustic metrology by combining high GHZ frequency ultrasound and scanning probe microscopy

Metrology, Inspection, and Process Control for Microlithography XXXIV ◽

10.1117/12.2552030 ◽

2020 ◽

Author(s):

Maarten H. van Es ◽

Benoit A. I. Quesson ◽

Abbas Mohtashami ◽

Daniele Piras ◽

Kodai Hatakeyama ◽

...

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Frequency Ultrasound

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Construction and Scanning Probe Microscopy Imaging of Two-dimensional Nanomaterials

Chemistry Letters ◽

10.1246/cl.200080 ◽

2020 ◽

Vol 49 (5) ◽

pp. 565-573 ◽

Cited By ~ 1

Author(s):

Masashi Kunitake ◽

Shinobu Uemura

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Two Dimensional ◽

Microscopy Imaging ◽

Probe Microscopy

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Characterization of carbon materials using high-resolution scanning probe microscopy

TANSO ◽

10.7209/tanso.2018.204 ◽

2018 ◽

Vol 2018 (285) ◽

pp. 204-209

Author(s):

Tomoko K. Shimizu

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Carbon Materials ◽

Scanning Probe ◽

Probe Microscopy

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High resolution optical characterization of cantilever arrays and multiple air-gap cavities for scanning probe microscopy, communication, analytics and sensing

IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2005. ◽

10.1109/omems.2005.1540109 ◽

2006 ◽

Author(s):

T. Scholz ◽

T. Depski ◽

F. Romer ◽

S. Imer ◽

V. Viereck ◽

...

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Optical Characterization ◽

Air Gap ◽

Scanning Probe ◽

Probe Microscopy ◽

Cantilever Arrays

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Recent advances in probing two-dimensional materials confined water by scanning probe microscopy

Chinese Science Bulletin (Chinese Version) ◽

10.1360/tb-2020-1501 ◽

2021 ◽

Vol 66 (14) ◽

pp. 1689-1702

Author(s):

Yue Hong ◽

Qiang Li

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Two Dimensional ◽

Confined Water ◽

Probe Microscopy ◽

Recent Advances ◽

Two Dimensional Materials

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Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy

Physics Letters A ◽

10.1016/j.physleta.2016.03.021 ◽

2016 ◽

Vol 380 (20) ◽

pp. 1750-1756 ◽

Cited By ~ 4

Author(s):

V.K. Tewary ◽

Rebecca C. Quardokus ◽

Frank W. DelRio

Keyword(s):

Green’S Function ◽

Green's Function ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Two Dimensional ◽

Probe Microscopy ◽

Two Dimensional Materials

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High-resolution morphological and electrical characterisation of organic bulk heterojunction solar cells by scanning probe microscopy

Progress in Photovoltaics Research and Applications ◽

10.1002/pip.795 ◽

2007 ◽

Vol 15 (8) ◽

pp. 713-726 ◽

Cited By ~ 25

Author(s):

O. Douhéret ◽

A. Swinnen ◽

S. Bertho ◽

I. Haeldermans ◽

J. D'Haen ◽

...

Keyword(s):

Solar Cells ◽

High Resolution ◽

Scanning Probe Microscopy ◽

Bulk Heterojunction ◽

Scanning Probe ◽

Probe Microscopy ◽

Heterojunction Solar Cells ◽

Bulk Heterojunction Solar Cells

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High-resolution 3D structural and optical analyses of hybrid or composite materials by means of scanning probe microscopy combined with the ultramicrotome technique: an example of application to engineering of liquid crystals doped with fluorescent quantum dots

10.1117/12.2017088 ◽

2013 ◽

Cited By ~ 3

Author(s):

Konstantin E. Mochalov ◽

Anton E. Efimov ◽

Alexey Yu. Bobrovsky ◽

Igor I. Agapov ◽

Anton A. Chistyakov ◽

...

Keyword(s):

Quantum Dots ◽

Composite Materials ◽

Liquid Crystals ◽

High Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Near-Field Acoustic Holography as a High Resolution Sub-Surface Imaging System on Scanning Probe Microscopy Platform: Seeing the Invisible

Microscopy and Microanalysis ◽

10.1017/s143192760550607x ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

G Shekhawat ◽

V P Dravid

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Imaging System ◽

Near Field ◽

Scanning Probe ◽

Surface Imaging ◽

Acoustic Holography ◽

Probe Microscopy ◽

The Invisible

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