Characterization of carbon materials using high-resolution scanning probe microscopy

TANSO ◽  
2018 ◽  
Vol 2018 (285) ◽  
pp. 204-209
Author(s):  
Tomoko K. Shimizu
Keyword(s):  
High Resolution ◽  
Scanning Probe Microscopy ◽  
Carbon Materials ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Preparation and Characterization of Optically-Resonant Atomically Flat Nanosurface Substrates for High-Resolution Scanning Probe Microscopy of Single Molecules

2006 ◽  
Vol 12 (S02) ◽  
pp. 510-511
Author(s):  
DH Dahayanaka ◽  
DW Kelle ◽  
DJ Wasielewski ◽  
ES Day ◽  
DR White ◽  
...  
Keyword(s):  
High Resolution ◽  
Scanning Probe Microscopy ◽  
Single Molecules ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Atomically Flat

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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