A beam expander facility for studying x‐ray optics

F. E. Christensen; A. Hornstrup; P. Frederiksen; C. Nilsson; P. Grundso/e; P. O/rup; E. Jacobsen; H. W. Schnopper; R. Lewis; C. Hall

doi:10.1063/1.1143124

A beam expander facility for studying x‐ray optics

Review of Scientific Instruments ◽

10.1063/1.1143124 ◽

1992 ◽

Vol 63 (1) ◽

pp. 1168-1171 ◽

Cited By ~ 5

Author(s):

F. E. Christensen ◽

A. Hornstrup ◽

P. Frederiksen ◽

C. Nilsson ◽

P. Grundso/e ◽

...

Keyword(s):

Ray Optics ◽

X Ray ◽

Beam Expander

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Characterization of ADP crystals for soft x-ray optics of the Beam Expander Testing X-ray facility (BEaTriX)

Advances in X-Ray/EUV Optics and Components XVI ◽

10.1117/12.2595143 ◽

2021 ◽

Author(s):

Claudio Ferrari ◽

Riccardo Lolli ◽

Bianca Salmaso ◽

Giovanni Pareschi ◽

Gianpiero Tagliaferri ◽

...

Keyword(s):

Ray Optics ◽

X Ray ◽

Beam Expander

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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