Higher order contributions in the synchrotron radiation spectrum of a toroidal grating monochromator determined by the use of a transmission grating

1989 ◽  
Vol 60 (7) ◽  
pp. 2101-2104 ◽  
Author(s):  
M. Kühne ◽  
P. Müller
Keyword(s):  
Synchrotron Radiation ◽  
Radiation Spectrum ◽  
Higher Order ◽  
Transmission Grating ◽  
Grating Monochromator

Higher-order suppression in an on-blaze plane-grating monochromator

1984 ◽  
Vol 23 (2) ◽  
pp. 293 ◽  
Author(s):  
William R. Hunter ◽  
J. C. Rife
Keyword(s):  
Higher Order ◽  
Grating Monochromator

scholarly journals Thermalization of synchrotron radiation from field-aligned currents

1988 ◽  
Vol 6 (3) ◽  
pp. 493-501 ◽  
Author(s):  
William Peter ◽  
Anthony L. Peratt
Keyword(s):  
Magnetic Field ◽  
Synchrotron Radiation ◽  
Energy Density ◽  
Radiation Spectrum ◽  
Axial Magnetic Field ◽  
Three Dimensional ◽  
Synchrotron Emission ◽  
Microwave Background ◽  
Strong Function ◽  
Current Filaments

Three-dimensional plasma simulations of interacting galactic-dimensioned current filaments show bursts of synchroton radiation of energy density 1·2 ×10−13 erg/cm3 which can be compared with the measured cosmic microwave background energy density of 1·5 × 10−13 erg/cm3. However, the synchrotron emission observed in the simulations is not blackbody. In this paper, we analyze the absorption of the synchrotron emission by the current filaments themselves (i.e., self-absorption) in order to investigate the thermalization of the emitted radiation. It is found that a large number of current filaments (>1031) are needed to make the radiation spectrum blackbody up to the observed measured frequency of 100 GHz. The radiation spectrum and the required number of current filaments is a strong function of the axial magnetic field in the filaments.

From First-Order Coherence to Higher-Order Coherence of Synchrotron Radiation

1998 ◽  
Vol 5 (3) ◽  
pp. 305-308 ◽  
Author(s):  
Tsuneaki Miyahara
Keyword(s):  
Synchrotron Radiation ◽  
Free Electron ◽  
Higher Order ◽  
Second Order ◽  
Free Electron Lasers ◽  
First Order ◽  
Noise Characteristics ◽  
The Difference

The difference between first-order and second-order coherence of synchrotron radiation is discussed in relation to how they can be measured and how they affect the noise characteristics of future free-electron lasers.

Higher-order suppression in diffraction-grating monochromators using thin films

1998 ◽  
Vol 5 (3) ◽  
pp. 783-785 ◽  
Author(s):  
F. M. Quinn ◽  
D. Teehan ◽  
M. MacDonald ◽  
S. Downes ◽  
P. Bailey
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Diffraction Grating ◽  
Higher Order ◽  
Photon Beam ◽  
Third Order ◽  
Suppression Efficiency ◽  
Desirable Feature ◽  
Oxide Contamination

Although a continuously tuneable source of photons is a very desirable feature of synchrotron radiation it has one main drawback: the contamination of the photon beam by higher-order diffracted light. Several elements have absorption edges which lie between 10 and 200 eV, a range prone to high second- and third-order content in XUV monochromators. They can, therefore, be used as transmission filters to reduce this higher-order content. This paper describes the use of thin filters to reduce the higher-order content in diffraction-grating monochromators. Their suppression efficiency, transmission and ageing have been characterized using photoelectron spectroscopy and compared with calculated values. The effect of oxide contamination on their performance has been assessed. Filters are now installed on eight XUV beamlines and have been in routine use for several years.

SYNCHROTRON-RADIATION-SUPPORTED HIGH-ASPECT-RATIO NANOFABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 79-88
Author(s):  
A. CHEN ◽  
G. LIU ◽  
L. K. JIAN ◽  
HERBERT O. MOSER
Keyword(s):  
Synchrotron Radiation ◽  
Aspect Ratio ◽  
Light Source ◽  
Process Parameters ◽  
High Aspect Ratio ◽  
Radiation Spectrum ◽  
Nanometer Scale ◽  
X Ray ◽  
Preliminary Results ◽  
Synchrotron Light

X-ray lithography with synchrotron radiation is an important nanolithographic tool which has unique advantages in the production of high aspect ratio nanostructures. The optimum synchrotron radiation spectrum for nanometer scale X-ray lithography is normally in the range of 500 eV to 2 keV. In this paper, we present the main methods, equipment, process parameters and preliminary results of nanofabrication by proximity X-ray lithography within the nanomanufacturing program pursued by Singapore Synchrotron Light Source (SSLS). Nanostructures with feature sizes down to 200 nm and an aspect ratio up to 10 have been successfully achieved by this approach.

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