Capacitance dilatometer for in situ measurement of radiation‐induced dimensional changes of solids

1987 ◽  
Vol 58 (7) ◽  
pp. 1284-1286
Author(s):  
Katsumi Tanimura ◽  
Noriaki Itoh ◽  
Kazuaki Arima ◽  
Hiroshi Imaike ◽  
Dale W. Heikkinen
1995 ◽  
Vol 219 ◽  
pp. 169-175 ◽  
Author(s):  
J.D. Hunn ◽  
R.E. Stoller ◽  
S.J. Zinkle

2019 ◽  
Vol 70 (3) ◽  
pp. 227-235
Author(s):  
Jiri Haze ◽  
Jiri Hofman

Abstract The paper discusses a novel temperature controller and a related test method allowing in-situ measurement of total ionising dose-induced changes in the impact of temperature on electronic devices for space applications. Various results of pilot radiation experiments (testing commercial PMOS transistors, RADFETs, and voltage references) are also presented.


1998 ◽  
Vol 83 (4) ◽  
pp. 1924-1930 ◽  
Author(s):  
D. P. White ◽  
L. L. Snead ◽  
S. J. Zinkle ◽  
W. S. Eatherly

Author(s):  
Charles W. Allen

Irradiation effects studies employing TEMs as analytical tools have been conducted for almost as many years as materials people have done TEM, motivated largely by materials needs for nuclear reactor development. Such studies have focussed on the behavior both of nuclear fuels and of materials for other reactor components which are subjected to radiation-induced degradation. Especially in the 1950s and 60s, post-irradiation TEM analysis may have been coupled to in situ (in reactor or in pile) experiments (e.g., irradiation-induced creep experiments of austenitic stainless steels). Although necessary from a technological point of view, such experiments are difficult to instrument (measure strain dynamically, e.g.) and control (temperature, e.g.) and require months or even years to perform in a nuclear reactor or in a spallation neutron source. Consequently, methods were sought for simulation of neutroninduced radiation damage of materials, the simulations employing other forms of radiation; in the case of metals and alloys, high energy electrons and high energy ions.


2003 ◽  
Vol 2 (4) ◽  
pp. 589
Author(s):  
Douglas R. Cobos ◽  
John M. Baker

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