Quantitative analysis of low‐energy Xe+ion bombardment damage of Si(100) surfaces using x‐ray photoelectron spectroscopy

Z. H. Lu; D. F. Mitchell; M. J. Graham

doi:10.1063/1.113018

Quantitative analysis of low‐energy Xe+ion bombardment damage of Si(100) surfaces using x‐ray photoelectron spectroscopy

Applied Physics Letters ◽

10.1063/1.113018 ◽

1994 ◽

Vol 65 (5) ◽

pp. 552-554 ◽

Cited By ~ 8

Author(s):

Z. H. Lu ◽

D. F. Mitchell ◽

M. J. Graham

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

Ion Bombardment ◽

Low Energy ◽

X Ray

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In situ analysis of Si(100) surface damage induced by low-energy rare-gas ion bombardment using x-ray photoelectron spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580714 ◽

1997 ◽

Vol 15 (3) ◽

pp. 820-824 ◽

Cited By ~ 5

Author(s):

Masahiko Ishii ◽

Yoshiharu Hirose ◽

Toshikazu Sato ◽

Takeshi Ohwaki ◽

Yasunori Taga

Keyword(s):

Photoelectron Spectroscopy ◽

Ion Bombardment ◽

Surface Damage ◽

Low Energy ◽

In Situ Analysis ◽

Rare Gas ◽

X Ray

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Quantitative analysis of thin oxide films using x‐ray photoelectron spectroscopy and rastered ion bombardment

Journal of Vacuum Science and Technology ◽

10.1116/1.569118 ◽

1977 ◽

Vol 14 (1) ◽

pp. 181-185 ◽

Cited By ~ 58

Author(s):

N. S. McIntyre ◽

D. G. Zetaruk

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

Oxide Films ◽

Ion Bombardment ◽

X Ray ◽

Thin Oxide Films ◽

Thin Oxide

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Quantitative analysis of saccharides by X-ray photoelectron spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.3047 ◽

2009 ◽

Vol 41 (6) ◽

pp. 453-462 ◽

Cited By ~ 50

Author(s):

Joanna S. Stevens ◽

Sven L. M. Schroeder

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray

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Structures of sulfur on TiO2() determined by scanning tunneling microscopy, X-ray photoelectron spectroscopy and low-energy electron diffraction

Surface Science ◽

10.1016/s0039-6028(00)00849-9 ◽

2001 ◽

Vol 470 (3) ◽

pp. 347-360 ◽

Cited By ~ 56

Author(s):

E.L.D. Hebenstreit ◽

W. Hebenstreit ◽

U. Diebold

Keyword(s):

Electron Diffraction ◽

Scanning Tunneling Microscopy ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Energy Electron ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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On the Quantitative Analysis of O0, O− and O2− Ions in Binary Silicate by X-Ray Photoelectron Spectroscopy

Journal of the Japan Institute of Metals and Materials ◽

10.2320/jinstmet1952.45.8_790 ◽

1981 ◽

Vol 45 (8) ◽

pp. 790-796 ◽

Cited By ~ 9

Author(s):

Toyoshige Sasaki ◽

Masanori Kawaguchi ◽

Masahiro Yamane ◽

Yukio Suginohara

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Binary Silicate

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Quantitative Analysis of Adsorbed Proteins by X-ray Photoelectron Spectroscopy

Analytical Chemistry ◽

10.1021/ac202110x ◽

2011 ◽

Vol 83 (22) ◽

pp. 8659-8666 ◽

Cited By ~ 73

Author(s):

Santanu Ray ◽

Alexander G. Shard

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Adsorbed Proteins

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Surface Band Structure Studies of Si Rich Reconstructions on 4H-SiC(1-100)

Materials Science Forum ◽

10.4028/www.scientific.net/msf.483-485.547 ◽

2005 ◽

Vol 483-485 ◽

pp. 547-550 ◽

Cited By ~ 4

Author(s):

Konstantin V. Emtsev ◽

Thomas Seyller ◽

Lothar Ley ◽

A. Tadich ◽

L. Broekman ◽

...

Keyword(s):

Electronic Structure ◽

Electron Diffraction ◽

Photoelectron Spectroscopy ◽

Low Energy ◽

Ultraviolet Photoelectron Spectroscopy ◽

Surface Band ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Different Temperatures ◽

Low Energy Electron

We have investigated Si-rich reconstructions of 4H-SiC( 00 1 1 ) surfaces by means of low-energy electron diffraction (LEED), x-ray photoelectron spectroscopy (XPS), and angleresolved ultraviolet photoelectron spectroscopy (ARUPS). The reconstructions of 4H-SiC( 00 1 1 ) were prepared by annealing the sample at different temperatures in a flux of Si. Depending on the temperature different reconstructions were observed: c(2×2) at T=800°C, c(2×4) at T=840°C. Both reconstructions show strong similarities in the electronic structure.

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Combined low‐energy ion scattering and x‐ray photoelectron spectroscopy study of Ta2O5 bombarded by 500–3000‐eV He ions

Journal of Vacuum Science and Technology ◽

10.1116/1.569675 ◽

1978 ◽

Vol 15 (2) ◽

pp. 702-705 ◽

Cited By ~ 17

Author(s):

G. C. Nelson

Keyword(s):

Photoelectron Spectroscopy ◽

Low Energy ◽

Spectroscopy Study ◽

Ion Scattering ◽

X Ray ◽

Low Energy Ion Scattering

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Surface oxidation of a Pt–20% CO alloy: An x‐ray photoelectron spectroscopy and low‐energy electron diffraction study on the [100] and [111] oriented single‐crystal surfaces

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575149 ◽

1988 ◽

Vol 6 (3) ◽

pp. 665-670 ◽

Cited By ~ 32

Author(s):

Ugo Bardi ◽

B. C. Beard ◽

P. N. Ross

Keyword(s):

Photoelectron Spectroscopy ◽

Surface Oxidation ◽

Electron Diffraction Study ◽

Low Energy ◽

Crystal Surfaces ◽

Single Crystal Surfaces ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Oriented Single Crystal

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Modification of RbTiOPO 4 (001) crystal surface induced by Ar + ion bombardment: X-ray photoelectron spectroscopy and first-principles studies

Vacuum ◽

10.1016/j.vacuum.2017.10.009 ◽

2018 ◽

Vol 147 ◽

pp. 38-44 ◽

Cited By ~ 4

Author(s):

Xiulan Duan ◽

Jian Liu ◽

Yang Chen ◽

Ziqing Li ◽

Pengfei Zhu ◽

...

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

Crystal Surface ◽

Ion Bombardment ◽

X Ray

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