Noncontact determination of transverse isotropic elastic moduli in polyimide thin films using a laser based ultrasonic method

1994 ◽  
Vol 65 (3) ◽  
pp. 312-314 ◽  
Author(s):  
John A. Rogers ◽  
Lisa Dhar ◽  
Keith A. Nelson
Keyword(s):  
Thin Films ◽  
Elastic Moduli ◽  
Ultrasonic Method ◽  
Transverse Isotropic

scholarly journals Determination of the elastic moduli and residual stresses of freestanding Au-TiW bilayer thin films by nanoindentation

2016 ◽  
Vol 106 ◽  
pp. 436-445 ◽  
Author(s):  
Matteo Ghidelli ◽  
Marco Sebastiani ◽  
Christian Collet ◽  
Raphael Guillemet
Keyword(s):  
Thin Films ◽  
Residual Stresses ◽  
Elastic Moduli

Transverse isotropic elastic moduli and in-plane thermal diffusivity in silicon-supported thin films of a photosensitive polyimide measured using impulsive stimulated thermal scattering

Polymer ◽  
1995 ◽  
Vol 36 (21) ◽  
pp. 4069-4075 ◽  
Author(s):  
Jennifer K. Cocson ◽  
Christine S. Hau ◽  
Peijou M. Lee ◽  
Clara C. Poon ◽  
Annita H. Zhong ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Diffusivity ◽  
Elastic Moduli ◽  
Transverse Isotropic ◽  
Thermal Scattering

Calculation of Intrinsic Stresses and Elastic Moduli in Nonhomogeneous Thin Films

2000 ◽  
Vol 653 ◽  
Author(s):  
Pedro C. Andia ◽  
Francesco Costanzo ◽  
Gary L. Gray ◽  
Thomas J. Yurick
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Residual Stresses ◽  
Computer Simulations ◽  
System Application ◽  
Elastic Moduli ◽  
Particle System ◽  
Particle Systems

AbstractAn approach is presented for the determination of the residual stresses and elastic moduli of particle systems resulting from computer simulations of particle or atomic deposition. The proposed technique is based on fundamental concepts of elasticity and is capable of capturing the variation of stresses and moduli as functions of position within the system. Application to a simple particle system consisting of a deposited thin film is demonstrated.

Sign in / Sign up

Export Citation Format

Share Document