Ballistic‐electron emission microscopy study of the Au/Si(111)7×7 and Au/CaF2/Si(111)7×7 interfaces

1994 ◽  
Vol 64 (17) ◽  
pp. 2300-2302 ◽  
Author(s):  
M. T. Cuberes ◽  
A. Bauer ◽  
H. J. Wen ◽  
M. Prietsch ◽  
G. Kaindl
Keyword(s):  
Electron Emission ◽  
Microscopy Study ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Ballistic electron emission microscopy study of transport in GaN thin films

1997 ◽  
Vol 70 (3) ◽  
pp. 330-332 ◽  
Author(s):  
E. G. Brazel ◽  
M. A. Chin ◽  
V. Narayanamurti ◽  
D. Kapolnek ◽  
E. J. Tarsa ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Emission ◽  
Microscopy Study ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC

2004 ◽  
Vol 457-460 ◽  
pp. 1077-1080 ◽  
Author(s):  
Y. Ding ◽  
K.B. Park ◽  
J.P. Pelz ◽  
A.V. Los ◽  
Michael S. Mazzola
Keyword(s):  
Electron Emission ◽  
Microscopy Study ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
P Type

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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