Ballistic electron emission microscopy study of Schottky contacts on 6H- and 4H-SiC

1998 ◽  
Vol 72 (7) ◽  
pp. 839-841 ◽  
Author(s):  
H.-J. Im ◽  
B. Kaczer ◽  
J. P. Pelz ◽  
W. J. Choyke
Keyword(s):  
Electron Emission ◽  
Microscopy Study ◽  
Schottky Contacts ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Ballistic electron emission microscopy study of transport in GaN thin films

1997 ◽  
Vol 70 (3) ◽  
pp. 330-332 ◽  
Author(s):  
E. G. Brazel ◽  
M. A. Chin ◽  
V. Narayanamurti ◽  
D. Kapolnek ◽  
E. J. Tarsa ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Emission ◽  
Microscopy Study ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Ballistic Electron Emission Microscopy Study of p-Type 4H-SiC

2004 ◽  
Vol 457-460 ◽  
pp. 1077-1080 ◽  
Author(s):  
Y. Ding ◽  
K.B. Park ◽  
J.P. Pelz ◽  
A.V. Los ◽  
Michael S. Mazzola
Keyword(s):  
Electron Emission ◽  
Microscopy Study ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
P Type
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