Inversion from selective homoepitaxy of Si to selective Si film deposition on SiO2using an ultraclean electron cyclotron resonance plasma

1992 ◽  
Vol 61 (24) ◽  
pp. 2908-2910 ◽  
Author(s):  
Takashi Matsuura ◽  
Tadahiro Ohmi ◽  
Junichi Murota ◽  
Shoichi Ono
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