Observation of reflection high energy electron diffraction intensity oscillations during Si molecular beam epitaxial growth from disilane

1992 ◽  
Vol 60 (18) ◽  
pp. 2255-2257 ◽  
Author(s):  
S. M. Mokler ◽  
W. K. Liu ◽  
N. Ohtani ◽  
B. A. Joyce
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