Surface reconstructions of Si(001) observed using reflection‐high‐ energy‐electron diffraction during molecular‐beam epitaxial growth from disilane

1991 ◽  
Vol 59 (26) ◽  
pp. 3419-3421 ◽  
Author(s):  
S. M. Mokler ◽  
W. K. Liu ◽  
N. Ohtani ◽  
B. A. Joyce
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