Optical modulation characteristics of a twin‐guide laser by an electric field

1991 ◽  
Vol 59 (21) ◽  
pp. 2721-2723 ◽  
Author(s):  
E. Yamamoto ◽  
M. Hamada ◽  
K. Suda ◽  
S. Nogiwa ◽  
T. Oki
Keyword(s):  
Electric Field ◽  
Optical Modulation

A temperature and electric field-responsive flexible smart film with full broadband optical modulation

2017 ◽  
Vol 4 (5) ◽  
pp. 878-884 ◽  
Author(s):  
Xiao Liang ◽  
Shumeng Guo ◽  
Mei Chen ◽  
Chenyue Li ◽  
Qian Wang ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Electric Field ◽  
Indium Oxide ◽  
Liquid Crystal Polymer ◽  
Optical Modulation ◽  
Crystal Polymer

This study provides a flexible multi-responsive smart film with a broadband optical modulation containing tin doped indium oxide nanocrystals and a phase-separated liquid crystal-polymer.

scholarly journals Optical modulation characteristics of VO2 thin film due to electric field induced phase transition in the FTO/VO2/FTO structure

2015 ◽  
Vol 64 (19) ◽  
pp. 198101
Author(s):  
Hao Ru-Long ◽  
Li Yi ◽  
Liu Fei ◽  
Sun Yao ◽  
Tang Jia-Yin ◽  
...  
Keyword(s):  
Thin Film ◽  
Phase Transition ◽  
Electric Field ◽  
Optical Modulation

An electric field measurement method based on electro-optical modulation for corona discharge in air

2019 ◽  
Vol 90 (8) ◽  
pp. 084704
Author(s):  
Xing Fan ◽  
Weijiang Chen ◽  
Qiaogen Zhang ◽  
Ming Chen ◽  
Tao Wen ◽  
...  
Keyword(s):  
Electric Field ◽  
Corona Discharge ◽  
Field Measurement ◽  
Measurement Method ◽  
Optical Modulation ◽  
Electric Field Measurement

scholarly journals Coupled GaAs/AlGaAs quantum‐well electroabsorption modulators for low‐electric‐field optical modulation

1989 ◽  
Vol 65 (1) ◽  
pp. 383-385 ◽  
Author(s):  
Nacer Debbar ◽  
Songcheol Hong ◽  
Jasprit Singh ◽  
Pallab Bhattacharya ◽  
Rajeshwar Sahai
Keyword(s):  
Electric Field ◽  
Quantum Well ◽  
Optical Modulation ◽  
Electroabsorption Modulators

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

Field-assisted ionization theory for microscopists

1994 ◽  
Vol 52 ◽  
pp. 820-821
Author(s):  
Patrick P. Camus
Keyword(s):  
Electric Field ◽  
Electron Tunneling ◽  
Ionization Probability ◽  
Critical Distance ◽  
Tunneling Probability ◽  
Field Ionization ◽  
Radius Of Curvature ◽  
Field Evaporation ◽  
A Value ◽  
Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

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