Characterization of Si/SiGe strained‐layer superlattices grown by ultrahigh vacuum/chemical vapor deposition technique

1991 ◽  
Vol 59 (7) ◽  
pp. 814-816 ◽  
Author(s):  
P. J. Wang ◽  
M. S. Goorsky ◽  
B. S. Meyerson ◽  
F. K. LeGoues ◽  
M. J. Tejwani
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