Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits

S.M. Menon; A.P. Jayasumana; Y.K. Malaiya; D.R. Clinkinbeard

doi:10.1049/ip-e.1993.0032

Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits

IEE Proceedings E (Computers and Digital Techniques) ◽

10.1049/ip-e.1993.0032 ◽

1993 ◽

Vol 140 (4) ◽

pp. 220-226 ◽

Cited By ~ 1

Author(s):

S.M. Menon ◽

A.P. Jayasumana ◽

Y.K. Malaiya ◽

D.R. Clinkinbeard

Keyword(s):

Bridging Faults

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Detection of stuck-at and bridging faults in reed—muller canonical (RMC) networks

IEE Proceedings E Computers and Digital Techniques ◽

10.1049/ip-e.1989.0058 ◽

1989 ◽

Vol 136 (5) ◽

pp. 430 ◽

Cited By ~ 2

Author(s):

T. Damarla ◽

M. Karpovsky

Keyword(s):

Bridging Faults

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Compact test generation for bridging faults under I/sub DDQ/ testing

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512654 ◽

2002 ◽

Cited By ~ 17

Author(s):

R.S. Reddy ◽

I. Pomeranz ◽

S.M. Reddy ◽

S. Kajihara

Keyword(s):

Test Generation ◽

Bridging Faults ◽

Compact Test

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An approach of diagnosing single bridging faults in CMOS combinational circuits

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367248 ◽

2002 ◽

Cited By ~ 5

Author(s):

K. Yamazaki ◽

T. Yamada

Keyword(s):

Combinational Circuits ◽

Bridging Faults

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The pros and cons of very-low-voltage testing: an analysis based on resistive bridging faults

22nd IEEE VLSI Test Symposium, 2004. Proceedings. ◽

10.1109/vtest.2004.1299240 ◽

2004 ◽

Cited By ~ 21

Author(s):

P. Engelke ◽

I. Polian ◽

M. Renovell ◽

B. Seshadri ◽

B. Becker

Keyword(s):

Low Voltage ◽

Bridging Faults ◽

Pros And Cons

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A new approach for diagnosing bridging faults in logic designs

2017 IEEE International Symposium on Circuits and Systems (ISCAS) ◽

10.1109/iscas.2017.8050914 ◽

2017 ◽

Cited By ~ 1

Author(s):

Amir Masoud Gharehbaghi ◽

Masahiro Fujita

Keyword(s):

Bridging Faults ◽

New Approach

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Distinguishing dynamic bridging faults and transition delay faults

2015 IEEE 11th International Conference on ASIC (ASICON) ◽

10.1109/asicon.2015.7516978 ◽

2015 ◽

Author(s):

Cheng-Hung Wu ◽

Saint James Lee ◽

Kuen-Jong Lee

Keyword(s):

Delay Faults ◽

Bridging Faults ◽

Transition Delay

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Test generation for current testing of bridging faults in CMOS VLSI circuits

38th Midwest Symposium on Circuits and Systems. Proceedings ◽

10.1109/mwscas.1995.504443 ◽

2002 ◽

Cited By ~ 1

Author(s):

T. Lee ◽

I.N. Hajj

Keyword(s):

Test Generation ◽

Vlsi Circuits ◽

Bridging Faults ◽

Current Testing ◽

Cmos Vlsi

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On detecting single and multiple bridging faults in CMOS circuits using the current supply monitoring method

10.1109/iscas.1990.111899 ◽

2002 ◽

Cited By ~ 18

Author(s):

K.-J. Lee ◽

M.A. Breuer

Keyword(s):

Cmos Circuits ◽

Bridging Faults ◽

Monitoring Method

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Modeling Feedback Bridging Faults with Non-Zero Resistance

Journal of Electronic Testing ◽

10.1007/s10836-005-5287-6 ◽

2005 ◽

Vol 21 (1) ◽

pp. 57-69 ◽

Cited By ~ 7

Author(s):

Ilia Polian ◽

Piet Engelke ◽

Michel Renovell ◽

Bernd Becker

Keyword(s):

Bridging Faults ◽

Zero Resistance

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Testing for Bridging Faults

Digital Systems Testing and Testable Design ◽

10.1109/9780470544389.ch7 ◽

2009 ◽

Keyword(s):

Bridging Faults

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