IOC-LP: hybrid test data compression∕decompression scheme for low power testing

2006 ◽  
Vol 153 (4) ◽  
pp. 391 ◽  
Author(s):  
S. Chun ◽  
Y. Kim ◽  
M.-H. Yang ◽  
S. Kang
Keyword(s):  
Low Power ◽  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Low Power Testing ◽  
Hybrid Test ◽  
Power Testing

scholarly journals Development of Low Power Test Data Compression Techniques for Digital VLSI Circuits

IJARCCE ◽  
2016 ◽  
Vol 5 (12) ◽  
pp. 423-425 ◽  
Author(s):  
Mr. Mohammad Iliyas ◽  
Mrs. Farha Anjum ◽  
Dr. Anil Kumar Sharma ◽  
Dr. R. Murali Prasad
Keyword(s):  
Low Power ◽  
Data Compression ◽  
Test Data ◽  
Vlsi Circuits ◽  
Test Data Compression ◽  
Power Test ◽  
Digital Vlsi ◽  
Low Power Test
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