An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.58 ◽

2008 ◽

Cited By ~ 2

Author(s):

Taejin Kim ◽

Sunghoon Chun ◽

Yongjoon Kim ◽

Myung-Hoon Yang ◽

Sungho Kang

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Method ◽

Hybrid Test ◽

Scan Chain

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Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2006.885830 ◽

2007 ◽

Vol 26 (6) ◽

pp. 1070-1083 ◽

Cited By ~ 38

Author(s):

Xrysovalantis Kavousianos ◽

Emmanouil Kalligeros ◽

Dimitris Nikolos

Keyword(s):

Data Compression ◽

Test Data ◽

Huffman Coding ◽

Test Data Compression ◽

Compression Method ◽

Efficient Test ◽

Ip Cores

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A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding

Journal of Electronic Testing ◽

10.1007/s10836-016-5562-8 ◽

2016 ◽

Vol 32 (1) ◽

pp. 59-68 ◽

Cited By ~ 6

Author(s):

Haiying Yuan ◽

Kun Guo ◽

Xun Sun ◽

Zijian Ju

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Method ◽

Power Efficient ◽

Run Length ◽

Efficient Test ◽

Run Length Coding

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A new test data compression method for system-on-a-chip

2010 3rd International Conference on Computer Science and Information Technology ◽

10.1109/iccsit.2010.5563909 ◽

2010 ◽

Cited By ~ 2

Author(s):

Bo Ye ◽

Min Luo

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Method ◽

System On A Chip

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Hybrid test data compression technique for SOC scan testing

2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics ◽

10.1109/socc.2005.1554457 ◽

2005 ◽

Author(s):

Sangwook Cho ◽

Jaehoon Song ◽

Hyunbean Yi ◽

Sungju Park

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Scan Testing ◽

Hybrid Test

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IOC-LP: hybrid test data compression∕decompression scheme for low power testing

IEE Proceedings - Circuits Devices and Systems ◽

10.1049/ip-cds:20050307 ◽

2006 ◽

Vol 153 (4) ◽

pp. 391 ◽

Cited By ~ 1

Author(s):

S. Chun ◽

Y. Kim ◽

M.-H. Yang ◽

S. Kang

Keyword(s):

Low Power ◽

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Low Power Testing ◽

Hybrid Test ◽

Power Testing

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Multi level huffman test data compression with multiple scan chain method

International Conference on Computing and Communication Technologies ◽

10.1109/iccct2.2014.7066738 ◽

2014 ◽

Author(s):

Srikanth Immareddy ◽

Sravan Kumar Talusani

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Multiple Scan ◽

Multi Level ◽

Scan Chain

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A Test Data Compression Method Based on K-L Transform

Proceedings of the 3rd International Conference on Computer Science and Service System ◽

10.2991/csss-14.2014.81 ◽

2014 ◽

Author(s):

Cheng Yali ◽

Kuang Jishun

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Method

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A Test Data Compression Method for System-on-a-Chip

4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) ◽

10.1109/delta.2008.30 ◽

2008 ◽

Cited By ~ 10

Author(s):

Jianhua Feng ◽

Guoliang Li

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Method ◽

System On A Chip

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Hybrid Test Data Compression Technique for Low-Power Scan Test Data

2007 International Symposium on Information Technology Convergence (ISITC 2007) ◽

10.1109/isitc.2007.11 ◽

2007 ◽

Cited By ~ 1

Author(s):

Jaehoon Song ◽

Junseop Lee ◽

Byeongjin Kim ◽

Taejin Jung ◽

Hyunbean Yi ◽

...

Keyword(s):

Low Power ◽

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Scan Test ◽

Hybrid Test

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MICRO: a new hybrid test data compression/decompression scheme

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2006.878227 ◽

2006 ◽

Vol 14 (6) ◽

pp. 649-654 ◽

Cited By ~ 3

Author(s):

Sunghoon Chun ◽

YongJoon Kim ◽

Jung-Been Im ◽

Sungho Kang

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Hybrid Test

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