CMOS differential logic family with self-timing and charge-recycling for high-speed and low-power VLSI

2003 ◽  
Vol 150 (1) ◽  
pp. 45 ◽  
Author(s):  
B.-S. Kong ◽  
J.-D. Im ◽  
Y.-C. Kim ◽  
S.-J. Jang ◽  
Y.-H. Jun
2020 ◽  
Vol 10 (5) ◽  
pp. 696-708
Author(s):  
Rumi Rastogi ◽  
Sujata Pandey ◽  
Mridula Gupta

Background: With the reducing size of the devices, the leakage power has also increased exponentially in the nano-scale CMOS devices. Several techniques have been devised so far to minimize the leakage power, among which, MTCMOS (power-gating) is the preferred one as it effectively minimizes the leakage power without any complexity in the circuit. However, the power-gating technique suffers from problems like transition noise and delay. In this paper, we proposed a new simple yet effective technique to minimize leakage power in MTCMOS circuits. Objective: The objective of the paper was to propose a new technique which effectively minimizes leakage power in nanoscale power-gated circuits with minimal delay, noise and area requirement so that it can well be implemented in high-speed low-power digital integrated circuits. Methods: A new power-gating structure has been proposed in this paper. The new proposed technique includes three parallel NMOS transistors with variable widths which are functional during the active mode to reduce the on-time delay. A PMOS footer with gate-bias is also connected in parallel with the NMOS footer transistors. The proposed technique has been verified through simulation in 45nm MTCMOS technology to implement a 32 bit adder circuit. Results: The proposed technique offers significant reduction in leakage power, reactivation noise and reactivation energy. The technique reduced the leakage power effectively at room temperature as well as higher temperatures. The reactivation noise produced by the proposed technique minimized by 98.7%, 64.8%, 62.07% and 24.47% as compared to the parallel transistor, variable-width, charge-recycling and the modified-charge recycling techniques respectively at room temperature.The reactivation energy of the proposed technique also minimized by 77.by 77.67%, 55.8%, 45.1%, and 18.32% with respect to the parallel transistor, variable-width, CR and Modified-CR techniques, respectively. Conclusion: The proposed technique offers significant reduction in leakage power, reactivation noise and reactivation energy. The technique reduces the leakage power effectively at room temperature as well as at higher temperatures. Since the delay and area overhead of the proposed structure is minimal, hence it can be easily implemented in high-speed low-power digital circuits.


2001 ◽  
Vol 37 (17) ◽  
pp. 1067 ◽  
Author(s):  
P. Celinski ◽  
J.F. López ◽  
S. Al-Sarawi ◽  
D. Abbott

2019 ◽  
Vol 7 (1) ◽  
pp. 24
Author(s):  
N. SURESH ◽  
K. S. SHAJI ◽  
KISHORE REDDY M. CHAITANYA ◽  
◽  
◽  
...  

Author(s):  
A. Suresh Babu ◽  
B. Anand

: A Linear Feedback Shift Register (LFSR) considers a linear function typically an XOR operation of the previous state as an input to the current state. This paper describes in detail the recent Wireless Communication Systems (WCS) and techniques related to LFSR. Cryptographic methods and reconfigurable computing are two different applications used in the proposed shift register with improved speed and decreased power consumption. Comparing with the existing individual applications, the proposed shift register obtained >15 to <=45% of decreased power consumption with 30% of reduced coverage area. Hence this proposed low power high speed LFSR design suits for various low power high speed applications, for example wireless communication. The entire design architecture is simulated and verified in VHDL language. To synthesis a standard cell library of 0.7um CMOS is used. A custom design tool has been developed for measuring the power. From the results, it is obtained that the cryptographic efficiency is improved regarding time and complexity comparing with the existing algorithms. Hence, the proposed LFSR architecture can be used for any wireless applications due to parallel processing, multiple access and cryptographic methods.


Author(s):  
Ahmed K. Jameil ◽  
Yasir Amer Abbas ◽  
Saad Al-Azawi

Background: The designed circuits are tested for faults detection in fabrication to determine which devices are defective. The design verification is performed to ensure that the circuit performs the required functions after manufacturing. Design verification is regarded as a test form in both sequential and combinational circuits. The analysis of sequential circuits test is more difficult than in the combinational circuit test. However, algorithms can be used to test any type of sequential circuit regardless of its composition. An important sequential circuit is the finite impulse response (FIR) filters that are widely used in digital signal processing applications. Objective: This paper presented a new design under test (DUT) algorithm for 4-and 8-tap FIR filters. Also, the FIR filter and the proposed DUT algorithm is implemented using field programmable gate arrays (FPGA). Method: The proposed test generation algorithm is implemented in VHDL using Xilinx ISE V14.5 design suite and verified by simulation. The test generation algorithm used FIR filtering redundant faults to obtain a set of target faults for DUT. The fault simulation is used in DUT to assess the benefit of test pattern in fault coverage. Results: The proposed technique provides average reductions of 20 % and 38.8 % in time delay with 57.39 % and 75 % reductions in power consumption and 28.89 % and 28.89 % slices reductions for 4- and 8-tap FIR filter, respectively compared to similar techniques. Conclusions: The results of implementation proved that a high speed and low power consumption design can be achieved. Further, the speed of the proposed architecture is faster than that of existing techniques.


Author(s):  
Sai Venkatramana Prasada G.S ◽  
G. Seshikala ◽  
S. Niranjana

Background: This paper presents the comparative study of power dissipation, delay and power delay product (PDP) of different full adders and multiplier designs. Methods: Full adder is the fundamental operation for any processors, DSP architectures and VLSI systems. Here ten different full adder structures were analyzed for their best performance using a Mentor Graphics tool with 180nm technology. Results: From the analysis result high performance full adder is extracted for further higher level designs. 8T full adder exhibits high speed, low power delay and low power delay product and hence it is considered to construct four different multiplier designs, such as Array multiplier, Baugh Wooley multiplier, Braun multiplier and Wallace Tree multiplier. These different structures of multipliers were designed using 8T full adder and simulated using Mentor Graphics tool in a constant W/L aspect ratio. Conclusion: From the analysis, it is concluded that Wallace Tree multiplier is the high speed multiplier but dissipates comparatively high power. Baugh Wooley multiplier dissipates less power but exhibits more time delay and low PDP.


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