CMOS-process-independent average power dissipation macromodelling

1995 ◽  
Vol 31 (16) ◽  
pp. 1337-1338 ◽  
Author(s):  
P.J. Mather ◽  
M. Brouwer ◽  
P. Hallam
Keyword(s):  
Power Dissipation ◽  
Average Power ◽  
Cmos Process

scholarly journals Comparative evaluation of quasi-delay-insensitive asynchronous adders corresponding to return-to-zero and return-to-one handshaking

2018 ◽  
Vol 31 (1) ◽  
pp. 25-39 ◽  
Author(s):  
Padmanabhan Balasubramanian
Keyword(s):  
Power Dissipation ◽  
Comparative Evaluation ◽  
Average Power ◽  
Cmos Process ◽  
Strong Indication ◽  
Ripple Carry Adder ◽  
Carry Select Adder ◽  
Handshake Protocol ◽  
Handshake Protocols ◽  
Better Than

This article makes a comparative evaluation of quasi-delay-insensitive (QDI) asynchronous adders, realized using the delay-insensitive dual-rail code, which adhere to 4-phase return-to-zero (RTZ) and 4-phase return-to-one (RTO) handshake protocols. The QDI adders realized correspond to the following adder architectures: i) ripple carry adder, ii) carry lookahead adder, and iii) carry select adder. The QDI adders correspond to three different timing regimes viz. strong-indication, weak-indication, and early output. They are physically implemented using a 32/28nm CMOS process. The comparative evaluation shows that, overall, QDI adders which correspond to the 4-phase RTO handshake protocol are better than the QDI adder counterparts which correspond to the 4-phase RTZ handshake protocol in terms of latency, area, and average power dissipation.

scholarly journals A Novel Cross-Latch Shift Register Scheme for Low Power Applications

2020 ◽  
Vol 11 (1) ◽  
pp. 129
Author(s):  
Po-Yu Kuo ◽  
Ming-Hwa Sheu ◽  
Chang-Ming Tsai ◽  
Ming-Yan Tsai ◽  
Jin-Fa Lin
Keyword(s):  
Power Consumption ◽  
Supply Voltage ◽  
Electrical Power ◽  
Average Power ◽  
Leakage Power ◽  
Shift Register ◽  
Cmos Process ◽  
Average Power Consumption ◽  
Simulation Results ◽  
Layout Area

The conventional shift register consists of master and slave (MS) latches with each latch receiving the data from the previous stage. Therefore, the same data are stored in two latches separately. It leads to consuming more electrical power and occupying more layout area, which is not satisfactory to most circuit designers. To solve this issue, a novel cross-latch shift register (CLSR) scheme is proposed. It significantly reduced the number of transistors needed for a 256-bit shifter register by 48.33% as compared with the conventional MS latch design. To further verify its functions, this CLSR was implemented by using TSMC 40 nm CMOS process standard technology. The simulation results reveal that the proposed CLSR reduced the average power consumption by 36%, cut the leakage power by 60.53%, and eliminated layout area by 34.76% at a supply voltage of 0.9 V with an operating frequency of 250 MHz, as compared with the MS latch.

scholarly journals Reduction of Power Dissipation in Dynamic BiCMOS Logic Gates by Transistor Reordering

VLSI Design ◽  
2002 ◽  
Vol 15 (2) ◽  
pp. 547-553
Author(s):  
S. M. Rezaul Hasan ◽  
Yufridin Wahab
Keyword(s):  
Power Dissipation ◽  
Figure Of Merit ◽  
Low Voltage ◽  
Logic Gates ◽  
Base Layer ◽  
Cmos Process ◽  
Silicon Area ◽  
Dynamic Power ◽  
Analog Cmos ◽  
Power Delay Product

This paper explores the deterministic transistor reordering in low-voltage dynamic BiCMOS logic gates, for reducing the dynamic power dissipation. The constraints of load driving (discharging) capability and NPN turn-on delay for MOSFET reordered structures has been carefully considered. Simulations shows significant reduction in the dynamic power dissipation for the transistor reordered BiCMOS structures. The power-delay product figure-of-merit is found to be significantly enhanced without any associated silicon-area penalty. In order to experimentally verify the reduction in power dissipation, original and reordered structures were fabricated using the MOSIS 2 μm N-well analog CMOS process which has a P-base layer for bipolar NPN option. Measured results shows a 20% reduction in the power dissipation for the transistor reordered structure, which is in close agreement with the simulation.

scholarly journals A CMOS-Thyristor Based Temperature Sensor with +0.37 °C/−0.32 °C Inaccuracy

Micromachines ◽  
2020 ◽  
Vol 11 (2) ◽  
pp. 124 ◽  
Author(s):  
Jing Li ◽  
Yuyu Lin ◽  
Siyuan Ye ◽  
Kejun Wu ◽  
Ning Ning ◽  
...  
Keyword(s):  
Power Consumption ◽  
Temperature Sensor ◽  
Current Source ◽  
Average Power ◽  
Bias Current ◽  
Cmos Process ◽  
Linear Temperature ◽  
Temperature Characteristics ◽  
Period Ratio ◽  
Average Power Consumption

This paper describes a voltage controlled oscillator (VCO) based temperature sensor. The VCOs are composed of complementary metal–oxide–semiconductor (CMOS) thyristor with the advantage of low power consumption. The period of the VCO is temperature dependent and is function of the transistors’ threshold voltage and bias current. To obtain linear temperature characteristics, this paper constructed the period ratio between two different-type VCOs. The period ratio is independent of the temperature characteristics from current source, which makes the bias current generator simplified. The temperature sensor was designed in 130 nm CMOS process and it occupies an active area of 0.06 mm2. Based on the post-layout simulation results, after a first-order fit, the sensor achieves an inaccuracy of +0.37/−0.32 °C from 0 °C to 80 °C, while the average power consumption of the sensor at room temperature is 156 nW.

An Improved CAL Register File with Dual-Threshold Technique for Leakage Reduction

2010 ◽  
Vol 159 ◽  
pp. 186-191 ◽  
Author(s):  
Jian Ping Hu ◽  
Jia Guo Zhu
Keyword(s):  
Integrated Circuits ◽  
Power Dissipation ◽  
Total Power ◽  
Cmos Process ◽  
Register File ◽  
Mos Transistors ◽  
Leakage Currents ◽  
Micro Power ◽  
Scaling Down ◽  
Threshold Technique

Scaling down sizes of MOS transistors has resulted in dramatic increase of leakage currents. The leakage dissipation caused by leakage currents is becoming an increasingly important fraction of the total power dissipation in nanometer integrated circuits. To decrease leakage power dissipations is becoming more and more important in micro-power nanometer circuits. An improved CAL register file using DTCMOS (Dual-Threshold Technique) for reducing leakage dissipations in active mode is addressed in this paper. The BSIM4 model is adopted to reflect the characteristics of the leakage currents. All circuits are simulated using HSPICE at 45nm CMOS process. Simulation results show that the register file with dual-threshold can reduce about 15.6% power dissipations.

scholarly journals Design of Low Power and Low Phase Noise Current Starved Ring Oscillator for RFID Tag EEPROM

2019 ◽  
pp. 19-23
Keyword(s):  
Low Power ◽  
Phase Noise ◽  
Power Dissipation ◽  
Supply Voltage ◽  
Ring Oscillator ◽  
Cmos Process ◽  
Clock Signal ◽  
Voltage Level ◽  
Rfid Tag ◽  
Low Phase Noise

Power dissipation of CMOS IC is a key factor in low power applications especially in RFID tag memories. Generally, tag memories like electrically erasable programmable read-only memory (EEPROM) require an internal clock generator to regulate the internal voltage level properly. In EEPROM, oscillator circuit can generate any periodic clock signal for frequency translation. Among different types of oscillators, a current starved ring oscillator (CSRO) is described in this research due to its very low current biasing source, which in turn restrict the current flows to reduce the overall power dissipation. The designed CSRO is limited to three stages to reduce the power dissipation to meet the specs. The simulated output shows that, the improved CSRO dissipates only 4.9 mW under the power supply voltage (VDD) 1.2 V in Silterra 130 nm CMOS process. Moreover, this designed oscillator has the lowest phase noise -119.38 dBc/Hz compared to other research works. In addition, the designed CSRO is able to reduce the overall chip area, which is only 0.00114 mm2. Therefore, this proposed low power and low phase noise CSRO will be able to regulate the voltage level successfully for low power RFID tag EEPROM.

scholarly journals Effect of CNTs Parameter Variation on the Performance of Analog Device

2020 ◽  
Vol 9 (4) ◽  
pp. 237-241
Keyword(s):  
Analog Circuits ◽  
Power Dissipation ◽  
High Speed ◽  
Ballistic Transport ◽  
Average Power ◽  
Systems Design ◽  
Parameter Variation ◽  
Charge Carriers ◽  
Analog Device ◽  
Current Carrying Capability

Carbon nanotubes (CNTs) have emerged as a prominent material for present day nano-scale systems design. In spite of their widespread use in biology, and nano-electro mechanical systems (NEMS, CNTs have encroached upon conventional MOSFETs for the design of low power and high speed circuits. Because CNT possesses higher current carrying capability, higher transconductance and near ballistic transport of charge carriers. The diameter of the CNTs laid from the Source to the Drain in a CNFET has the significant influence on the characteristics of the device itself as well as on the features of circuits implemented using the said CNFET. Such variations in circuit parameters with CNT diameter can be shown to be more pronounced in analog circuits as compared to digital CNFET-based designs. The present work attempts to investigate the effect of diameter variation on a versatile analog building block (ABB) viz. the inverting current conveyor. It is demonstrated that various parameters of the ICC-II under scrutiny, like voltage bandwidth, current bandwidth, average power dissipation, etc. depend on the diameter of CNT(s) used in the CNFETs. HSPICE simulations performed on a 0.9V; 32nm CNFET-based ICC-II are included to exemplify the dependencies studied.

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