Fabrication of a new type of field-effect transistor using neutralisation of shallow donors by atomic hydrogen in n-GaAs (Si)

1987 ◽  
Vol 23 (16) ◽  
pp. 841 ◽  
Author(s):  
E. Constant ◽  
N. Caglio ◽  
J. Chevallier ◽  
J.C. Pesant
2017 ◽  
Vol 17 (11) ◽  
pp. 8280-8284
Author(s):  
Ryoongbin Lee ◽  
Dae Woong Kwon ◽  
Sihyun Kim ◽  
Hyun-Sun Mo ◽  
Dae Hwan Kim ◽  
...  

1993 ◽  
Vol 14 (1-3) ◽  
pp. 659-660 ◽  
Author(s):  
Izumi Kubo ◽  
Atsushi Seki ◽  
Hiroaki Tomioka ◽  
Hiroyuki Sasabe

The Analyst ◽  
2014 ◽  
Vol 139 (16) ◽  
pp. 3852-3855 ◽  
Author(s):  
Jin Wook Park ◽  
Seon Joo Park ◽  
Oh Seok Kwon ◽  
Choonghyen Lee ◽  
Jyongsik Jang

A new type of field-effect transistor (FET) sensor, based on reduced graphene oxide (rGO)–polyfuran (PF) nanohybrids, was strategically developed.


2004 ◽  
Vol 811 ◽  
Author(s):  
Nobuyuki Iwata ◽  
Koji Matsuo ◽  
Noriaki Ootsuka ◽  
Hiroshi Yamamoto

ABSTRACTWe proposed the magnetoelectric (ME) effect as a new function of oxides electronic devices. The ME effect is characterized by the appearance of an induced magnetization with electric field applied and also is true in the opposite way. As one of the oxides devices we proposed a new type of Josephson field effect transistor (JFET) as adopting the ME materials to a gate insulator. In such the device, considering the Fraunhofer pattern, large IC modulation was expected by the induced magnetic field. Representative ME material, Cr2O3 films were deposited on Josephson junctions which were formed bygrain boundaries in YBa2Cu3OX (YBCO) films grown on MgO substrates. The multilayered films, Cr2O3 /YBCO and Cr2O3 / Y2O3 / YBCO were studied as the model of JFET.


2010 ◽  
Vol E93-C (5) ◽  
pp. 540-545 ◽  
Author(s):  
Dong Seup LEE ◽  
Hong-Seon YANG ◽  
Kwon-Chil KANG ◽  
Joung-Eob LEE ◽  
Jung Han LEE ◽  
...  

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