On-surface chemical reactions characterised by ultra-high resolution scanning probe microscopy

Adam Sweetman; Neil R. Champness; Alex Saywell

doi:10.1039/d0cs00166j

On-surface chemical reactions characterised by ultra-high resolution scanning probe microscopy

Chemical Society Reviews ◽

10.1039/d0cs00166j ◽

2020 ◽

Vol 49 (13) ◽

pp. 4189-4202 ◽

Cited By ~ 3

Author(s):

Adam Sweetman ◽

Neil R. Champness ◽

Alex Saywell

Keyword(s):

High Resolution ◽

Chemical Reactions ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Reactions ◽

The Impact

The impact of high resolution scanning probe microscopy on imaging individual molecules with intramolecular resolution is reviewed.

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Characterisation and Interpretation of On‐Surface Chemical Reactions Studied by Ultra‐High‐Resolution Scanning Probe Microscopy

10.1002/9783527816699.ch2 ◽

2021 ◽

pp. 9-42

Author(s):

Adam Sweetman ◽

Neil R. Champness ◽

Alex Saywell

Keyword(s):

High Resolution ◽

Chemical Reactions ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Reactions

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Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope

10.3403/30165037 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Near Field ◽

Optical Microscope ◽

Scanning Probe ◽

Lateral Resolution ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate

10.3403/30199183 ◽

2012 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Drift Rate ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Microscopy Measurement ◽

Surface Chemical Analysis

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Surface chemical analysis. Data transfer format for scanning-probe microscopy

10.3403/30199180 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Data Transfer ◽

Analysis Data ◽

Scanning Probe ◽

Surface Chemical ◽

Chemical Analysis Data ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants

10.3403/30199161 ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Spring Constants ◽

Surface Chemical Analysis

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Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

10.3403/30203228u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Spatial Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Surface Chemical ◽

Probe Microscopy ◽

Surface Chemical Analysis

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Progress in High-resolution Scanning Probe Microscopy

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85228-5_2 ◽

2008 ◽

pp. 3-4

Author(s):

A. Engel ◽

P. Bosshart ◽

P. Frederix ◽

S. A. Müller

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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High resolution acoustic metrology by combining high GHZ frequency ultrasound and scanning probe microscopy

Metrology, Inspection, and Process Control for Microlithography XXXIV ◽

10.1117/12.2552030 ◽

2020 ◽

Author(s):

Maarten H. van Es ◽

Benoit A. I. Quesson ◽

Abbas Mohtashami ◽

Daniele Piras ◽

Kodai Hatakeyama ◽

...

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Frequency Ultrasound

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Characterization of carbon materials using high-resolution scanning probe microscopy

TANSO ◽

10.7209/tanso.2018.204 ◽

2018 ◽

Vol 2018 (285) ◽

pp. 204-209

Author(s):

Tomoko K. Shimizu

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Carbon Materials ◽

Scanning Probe ◽

Probe Microscopy

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High resolution optical characterization of cantilever arrays and multiple air-gap cavities for scanning probe microscopy, communication, analytics and sensing

IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2005. ◽

10.1109/omems.2005.1540109 ◽

2006 ◽

Author(s):

T. Scholz ◽

T. Depski ◽

F. Romer ◽

S. Imer ◽

V. Viereck ◽

...

Keyword(s):

High Resolution ◽

Scanning Probe Microscopy ◽

Optical Characterization ◽

Air Gap ◽

Scanning Probe ◽

Probe Microscopy ◽

Cantilever Arrays

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