scholarly journals Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

2020 ◽  
Vol 56 (30) ◽  
pp. 4204-4207 ◽  
Author(s):  
Andrew M. Levine ◽  
Guanhong Bu ◽  
Sankarsan Biswas ◽  
Esther H. R. Tsai ◽  
Adam B. Braunschweig ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Electron Diffraction ◽  
Organic Semiconductor ◽  
Grazing Incidence ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Semiconductor Thin Films ◽  
Insight Into

The complementary methods of MicroED and GIWAXS provide insight into crystal structure arrangement in organic semiconductor thin films.

scholarly journals Thermal unequilibrium of strained black CsPbI3 thin films

Science ◽  
2019 ◽  
Vol 365 (6454) ◽  
pp. 679-684 ◽  
Author(s):  
Julian A. Steele ◽  
Handong Jin ◽  
Iurii Dovgaliuk ◽  
Robert F. Berger ◽  
Tom Braeckevelt ◽  
...  
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Optoelectronic Devices ◽  
Grazing Incidence ◽  
Optically Active ◽  
Wide Angle ◽  
Biaxial Strain ◽  
X Ray ◽  
X Ray Scattering ◽  
Thermal Stability Of

The high-temperature, all-inorganic CsPbI3 perovskite black phase is metastable relative to its yellow, nonperovskite phase at room temperature. Because only the black phase is optically active, this represents an impediment for the use of CsPbI3 in optoelectronic devices. We report the use of substrate clamping and biaxial strain to render black-phase CsPbI3 thin films stable at room temperature. We used synchrotron-based, grazing incidence, wide-angle x-ray scattering to track the introduction of crystal distortions and strain-driven texture formation within black CsPbI3 thin films when they were cooled after annealing at 330°C. The thermal stability of black CsPbI3 thin films is vastly improved by the strained interface, a response verified by ab initio thermodynamic modeling.

scholarly journals The Diffraction Pattern Calculator(DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data

2014 ◽  
Vol 47 (6) ◽  
pp. 2090-2099 ◽  
Author(s):  
Anna K. Hailey ◽  
Anna M. Hiszpanski ◽  
Detlef-M. Smilgies ◽  
Yueh-Lin Loo
Keyword(s):  
Crystal Structure ◽  
Grazing Incidence ◽  
Unit Cell ◽  
Lattice Parameters ◽  
Scattering Data ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

TheDPCtoolkit is a simple-to-use computational tool that helps users identify the unit-cell lattice parameters of a crystal structure that are consistent with a set of two-dimensional grazing-incidence wide-angle X-ray scattering data. The input data requirements are minimal and easy to assemble from data sets collected with any position-sensitive detector, and the user is required to make as few initial assumptions about the crystal structure as possible. By selecting manual or automatic modes of operation, the user can either visually match the positions of the experimental and calculated reflections by individually tuning the unit-cell parameters or have the program perform this process for them. Examples that demonstrate the utility of this program include determining the lattice parameters of a polymorph of a fluorinated contorted hexabenzocoronene in a blind test and refining the lattice parameters of the thin-film phase of 5,11-bis(triethylsilylethynyl)anthradithiophene with the unit-cell dimensions of its bulk crystal structure being the initial inputs.

Microstructure variations induced by excess PbX2or AX within perovskite thin films

2017 ◽  
Vol 53 (96) ◽  
pp. 12966-12969 ◽  
Author(s):  
Guanhaojie Zheng ◽  
Cheng Zhu ◽  
Yihua Chen ◽  
Juchen Zhang ◽  
Qi Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
Stoichiometric Ratio ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Hybrid Perovskite ◽  
Scattering Technique ◽  
The Impact

We investigated the impact of stoichiometric ratio of PbX2/AX on microstructures within hybrid perovskite films, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering technique.

Studies of ZnSe-based semiconductor thin films using grazing incidence x-ray scattering and diffraction

1999 ◽  
Vol 85 (1) ◽  
pp. 237-243
Author(s):  
S. Huang ◽  
Y. L. Soo ◽  
Z. H. Ming ◽  
Y. H. Kao ◽  
M. H. Na ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Semiconductor Thin Films ◽  
Ray Scattering

scholarly journals The effect of confinement on the crystalline microstructure of polymer : fullerene bulk heterojunctions

2015 ◽  
Vol 17 (36) ◽  
pp. 23326-23331 ◽  
Author(s):  
A. Ashraf ◽  
D. M. N. M. Dissanayake ◽  
M. D. Eisaman
Keyword(s):  
Thin Films ◽  
Bulk Heterojunction ◽  
Grazing Incidence ◽  
Wide Angle ◽  
Bulk Heterojunctions ◽  
X Ray ◽  
X Ray Scattering ◽  
Polymer Component ◽  
Crystalline Microstructure ◽  
Ray Scattering

We investigate the effect of confinement on the crystalline microstructure of the polymer component of polymer : fullerene bulk heterojunction thin films using grazing incidence wide angle X-ray scattering.

scholarly journals Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering

2017 ◽  
Vol 121 (20) ◽  
pp. 205306 ◽  
Author(s):  
G. B. González ◽  
J. S. Okasinski ◽  
D. B. Buchholz ◽  
J. Boesso ◽  
J. D. Almer ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Indium Oxide ◽  
Grazing Incidence ◽  
Ex Situ ◽  
Wide Angle ◽  
Oxide Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
Sign in / Sign up

Export Citation Format

Share Document