Microstructure variations induced by excess PbX2or AX within perovskite thin films

2017 ◽  
Vol 53 (96) ◽  
pp. 12966-12969 ◽  
Author(s):  
Guanhaojie Zheng ◽  
Cheng Zhu ◽  
Yihua Chen ◽  
Juchen Zhang ◽  
Qi Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
Stoichiometric Ratio ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Hybrid Perovskite ◽  
Scattering Technique ◽  
The Impact

We investigated the impact of stoichiometric ratio of PbX2/AX on microstructures within hybrid perovskite films, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering technique.

scholarly journals Thermal unequilibrium of strained black CsPbI3 thin films

Science ◽  
2019 ◽  
Vol 365 (6454) ◽  
pp. 679-684 ◽  
Author(s):  
Julian A. Steele ◽  
Handong Jin ◽  
Iurii Dovgaliuk ◽  
Robert F. Berger ◽  
Tom Braeckevelt ◽  
...  
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Optoelectronic Devices ◽  
Grazing Incidence ◽  
Optically Active ◽  
Wide Angle ◽  
Biaxial Strain ◽  
X Ray ◽  
X Ray Scattering ◽  
Thermal Stability Of

The high-temperature, all-inorganic CsPbI3 perovskite black phase is metastable relative to its yellow, nonperovskite phase at room temperature. Because only the black phase is optically active, this represents an impediment for the use of CsPbI3 in optoelectronic devices. We report the use of substrate clamping and biaxial strain to render black-phase CsPbI3 thin films stable at room temperature. We used synchrotron-based, grazing incidence, wide-angle x-ray scattering to track the introduction of crystal distortions and strain-driven texture formation within black CsPbI3 thin films when they were cooled after annealing at 330°C. The thermal stability of black CsPbI3 thin films is vastly improved by the strained interface, a response verified by ab initio thermodynamic modeling.

Application of Grazing-Incidence Small-Angle X-Ray Scattering Technique to Semiconducting Composite Materials

2005 ◽  
Vol 475-479 ◽  
pp. 1097-1100 ◽  
Author(s):  
T. Ogawa ◽  
H. Niwa ◽  
Hiroshi Okuda ◽  
Shojiro Ochiai
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
Dimensional Model ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Two Dimensional Model ◽  
Scattering Technique ◽  
Best Fitting

Grazing-incidence small-angle scattering (GI-SAXS) technique was applied to self-assembled Ge islands capped with Si. GI-SAXS has a merit over TEM and AFM that the structure of islands buried in a cap layer for stabilization can be evaluated nondestructively. By analyzing the scattering patterns, the size of Ge islands was estimated to be about 5 nm in height and 26 nm in diameter, with the islands density of 4.2×1014/m2. From the best fitting of two-dimensional model intensity to the experiments, the shape of the islands was deduced

scholarly journals The Diffraction Pattern Calculator(DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data

2014 ◽  
Vol 47 (6) ◽  
pp. 2090-2099 ◽  
Author(s):  
Anna K. Hailey ◽  
Anna M. Hiszpanski ◽  
Detlef-M. Smilgies ◽  
Yueh-Lin Loo
Keyword(s):  
Crystal Structure ◽  
Grazing Incidence ◽  
Unit Cell ◽  
Lattice Parameters ◽  
Scattering Data ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

TheDPCtoolkit is a simple-to-use computational tool that helps users identify the unit-cell lattice parameters of a crystal structure that are consistent with a set of two-dimensional grazing-incidence wide-angle X-ray scattering data. The input data requirements are minimal and easy to assemble from data sets collected with any position-sensitive detector, and the user is required to make as few initial assumptions about the crystal structure as possible. By selecting manual or automatic modes of operation, the user can either visually match the positions of the experimental and calculated reflections by individually tuning the unit-cell parameters or have the program perform this process for them. Examples that demonstrate the utility of this program include determining the lattice parameters of a polymorph of a fluorinated contorted hexabenzocoronene in a blind test and refining the lattice parameters of the thin-film phase of 5,11-bis(triethylsilylethynyl)anthradithiophene with the unit-cell dimensions of its bulk crystal structure being the initial inputs.

scholarly journals In situ grazing-incidence wide-angle X-ray scattering for hybrid perovskite semiconductors

2019 ◽  
Vol 75 (a1) ◽  
pp. a56-a56
Author(s):  
Hsinhan Tsai ◽  
Cunming Liu ◽  
Aditya Mohite ◽  
Xiaoyi Zhang ◽  
Joseph Strzalka ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Wide Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Hybrid Perovskite ◽  
Ray Scattering

scholarly journals The effect of confinement on the crystalline microstructure of polymer : fullerene bulk heterojunctions

2015 ◽  
Vol 17 (36) ◽  
pp. 23326-23331 ◽  
Author(s):  
A. Ashraf ◽  
D. M. N. M. Dissanayake ◽  
M. D. Eisaman
Keyword(s):  
Thin Films ◽  
Bulk Heterojunction ◽  
Grazing Incidence ◽  
Wide Angle ◽  
Bulk Heterojunctions ◽  
X Ray ◽  
X Ray Scattering ◽  
Polymer Component ◽  
Crystalline Microstructure ◽  
Ray Scattering

We investigate the effect of confinement on the crystalline microstructure of the polymer component of polymer : fullerene bulk heterojunction thin films using grazing incidence wide angle X-ray scattering.

scholarly journals Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering

2017 ◽  
Vol 121 (20) ◽  
pp. 205306 ◽  
Author(s):  
G. B. González ◽  
J. S. Okasinski ◽  
D. B. Buchholz ◽  
J. Boesso ◽  
J. D. Almer ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Indium Oxide ◽  
Grazing Incidence ◽  
Ex Situ ◽  
Wide Angle ◽  
Oxide Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Detailed analysis of gyroid structures in diblock copolymer thin films with synchrotron grazing-incidence X-ray scattering

2007 ◽  
Vol 40 (5) ◽  
pp. 950-958 ◽  
Author(s):  
Sangwoo Jin ◽  
Jinhwan Yoon ◽  
Kyuyoung Heo ◽  
Hae-Woong Park ◽  
Jehan Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Diblock Copolymer ◽  
Grazing Incidence ◽  
Orientation Distribution ◽  
Lattice Parameter ◽  
Two Dimensional ◽  
Distortion Factor ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for gyroid structures formed in thin films supported on substrates. Two-dimensional GIXS patterns were measured for gyroid structures formed in polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer nanometre-scale thin films supported on silicon substrates, and a quantitative analysis of the obtained two-dimensional GIXS data was conducted with the scattering formula. This analysis provided details (lattice parameter, width of the PS phase, positional distortion factor, orientation and orientation distribution) of the gyroid structures developed in the diblock copolymer thin films that are not easily obtained using conventional techniques. Moreover, it was possible to simulate complete and detailed two-dimensional GIXS patterns with the determined structure parameters.

Visualizing patterned thin films by grazing-incidence small-angle X-ray scattering coupled with computed tomography

2015 ◽  
Vol 48 (6) ◽  
pp. 1645-1650 ◽  
Author(s):  
Hiroki Ogawa ◽  
Yukihiro Nishikawa ◽  
Akihiko Fujiwara ◽  
Mikihito Takenaka ◽  
Yi-Chin Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Computed Tomography ◽  
Small Angle ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Model Sample ◽  
Ray Scattering

Images of the spatial distribution of nanostructures in thin films were successfully reconstructed by grazing-incidence small-angle X-ray scattering (GISAXS) coupled with computed tomography (CT) measurements. As a model sample of inhomogeneous thin films, a thin film was patterned with four characters (F, B, S and L) consisting of nanoparticles of gold (Au), platinum (Pt), Au/Pt and Pt/Au, respectively, on a silicon substrate. The characters each produced respective two-dimensional GISAXS images which reflect the nanoparticle structures and their correlations in the thin film. The application of the GISAXS-CT technique to the characteristic scattering GISAXS intensity of each component enables one to reconstruct the images of each character independently. Moreover, it was found that the patterned images could be reconstructed even from very weak scattered intensities at higherqpositions and the diffuse intensities. These results indicate that the GISAXS-CT method is a powerful tool to obtain distinct reconstruction images detailing the particle size, shape and surface roughness.

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