Cross-correlated humidity-dependent structural evolution of Nafion thin films confined on a platinum substrate

Soft Matter ◽  
2020 ◽  
Vol 16 (5) ◽  
pp. 1190-1200 ◽  
Author(s):  
Udit N. Shrivastava ◽  
Kota Suetsugu ◽  
Shusaku Nagano ◽  
Helmut Fritzsche ◽  
Yuki Nagao ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Evolution ◽  
Structure And Properties

We cross-correlate the hydration-dependent structure and properties – microscopic and macroscopic – of a thin Nafion ionomer film on an electrochemically pertinent Pt substrate.

Correlation between structure and properties of Er2O3 nanocrystalline thin films

2008 ◽  
Vol 354 (19-25) ◽  
pp. 2853-2857 ◽  
Author(s):  
Maria M. Giangregorio ◽  
Alberto Sacchetti ◽  
Maria Losurdo ◽  
Pio Capezzuto ◽  
Giovanni Bruno
Keyword(s):  
Thin Films ◽  
Structure And Properties ◽  
Nanocrystalline Thin Films

Structural Evolution Upon Annealing of Multi-Layer Si/Fe Thin Films Prepared by Magnetron Sputtering

2007 ◽  
Vol 561-565 ◽  
pp. 1161-1164
Author(s):  
Xiao Na Li ◽  
Bing Hu ◽  
Chuang Dong ◽  
Xin Jiang
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Room Temperature ◽  
Structural Evolution ◽  
Radio Frequency Magnetron Sputtering ◽  
Transmission Electron ◽  
Direct Band ◽  
The Stability ◽  
Sputtering System

Fe/Si multi-layer films were fabricated on Si (100) substrates utilizing radio frequency magnetron sputtering system. Si/β-FeSi2 structure was found in the films after the deposition. Structural characterization of Fe-silicide sample was performed by transmission electron microscopy, to explore the dependence of the microstructure of β-FeSi2 film on the preparation parameters. It was found that β-FeSi2 particles were formed after the deposition without annealing, whose size is less than 20nm ,with a direct band-gap of 0.94eV in room temperature. After annealing at 850°C, particles grow lager, however the stability of thin films was still good.

scholarly journals Morphological and Structural Evolution of Chemically Deposited Epitaxially LaNiO3 Thin Films

Coatings ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1376
Author(s):  
Mircea Nasui ◽  
Ramona Bianca Sonher ◽  
Ecaterina Ware ◽  
Andrada Daniel ◽  
Traian Petrisor ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Analyses ◽  
Structural Evolution ◽  
Precursor Solution ◽  
Solution Deposition ◽  
Chemical Solution Deposition Method ◽  
Out Of Plane ◽  
Optimal Surface ◽  
Decomposition Behavior ◽  
Surface Morphologies

We report the preparation and characterization of epitaxial LaNiO3 (LNO) thin films by chemical solution deposition method using lanthanum and nickel acetylacetonates as starting reagents dissolved in propionic acid. In order to obtain further information regarding the decomposition behavior of the film, the precursor solution was dried to obtain the precursor powder, which was investigated by thermal analyses and X-ray diffraction measurements (XRD). The LNO perovskite thin films were deposited by spin coating on SrTiO3(100) single crystal substrates. A detailed study with different crystallization temperatures (600–900 °C) at two different heating ramps (5 and 10 °C/min) was performed. Oriented LaNiO3 thin films with good out-of-plane textures were obtained with optimal surface morphologies.

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