scholarly journals Controlling magnetism of Au133(TBBT)52 nanoclusters at single electron level and implication for nonmetal to metal transition

2019 ◽  
Vol 10 (42) ◽  
pp. 9684-9691 ◽  
Author(s):  
Chenjie Zeng ◽  
Andrew Weitz ◽  
Gayathri Withers ◽  
Tatsuya Higaki ◽  
Shuo Zhao ◽  
...  
Keyword(s):  
Unpaired Electron ◽  
Single Electron ◽  
Electron Level

The [Au133(SR)52]q nanocluster is discovered to possess one spin per particle when q = 0, but no unpaired electron when q = +1.

Atomic-precision engineering of metal nanoclusters

2020 ◽  
Vol 49 (31) ◽  
pp. 10701-10707 ◽  
Author(s):  
Xiangsha Du ◽  
Rongchao Jin
Keyword(s):  
Single Electron ◽  
Single Atom ◽  
Metal Nanoclusters ◽  
Electron Level ◽  
Precision Engineering ◽  
Atomic Precision

This frontier article illustrates single-atom, single-electron level engineering for tailoring the properties of metal nanoclusters using gold as a model.

scholarly journals Giant exchange coupling and field-induced slow relaxation of magnetization in Gd2@C79N with a single-electron Gd–Gd bond

2018 ◽  
Vol 54 (23) ◽  
pp. 2902-2905 ◽  
Author(s):  
G. Velkos ◽  
D. S. Krylov ◽  
K. Kirkpatrick ◽  
X. Liu ◽  
L. Spree ◽  
...  
Keyword(s):  
Electron Spin ◽  
Unpaired Electron ◽  
Exchange Coupling ◽  
Magnetic Moments ◽  
Slow Relaxation ◽  
Single Electron ◽  
Ferromagnetic Coupling

Single-electron Gd–Gd bond in Gd2@C79N results in giant ferromagnetic coupling between local 4f magnetic moments and unpaired electron spin.

scholarly journals Reducing Radiation Damage in Soft Matter with Femtosecond Timed Single-Electron Packets

2019 ◽  
Author(s):  
Elisah VandenBussche ◽  
David Flannigan
Keyword(s):  
Electron Microscope ◽  
Laser Pulse ◽  
Femtosecond Laser ◽  
Radiation Damage ◽  
Soft Matter ◽  
Single Electron ◽  
Electron Level ◽  
Precise Control ◽  
Transmission Electron ◽  
Conventional Transmission Electron Microscope

We study the effects on radiation damage of using a femtosecond laser-driven, pulsed electron source in an otherwise conventional transmission electron microscope. We demonstrate precise control - at the single electron level - over the emission timing and the number of electrons emitted with each femtosecond laser pulse. We find that radiation damage is significantly reduced for such pulsed beams when compared to conventional ultralow-dose methods for the same dose rate and the same total dose. We also show that the degree of damage can be controlled by carefully varying the time between arrival of each electron at the specimen and by changing the number of electrons in each packet.<br>

scholarly journals Reducing Radiation Damage in Soft Matter with Femtosecond Timed Single-Electron Packets

2019 ◽  
Author(s):  
Elisah VandenBussche ◽  
David Flannigan
Keyword(s):  
Electron Microscope ◽  
Laser Pulse ◽  
Femtosecond Laser ◽  
Radiation Damage ◽  
Soft Matter ◽  
Single Electron ◽  
Electron Level ◽  
Precise Control ◽  
Transmission Electron ◽  
Conventional Transmission Electron Microscope

We study the effects on radiation damage of using a femtosecond laser-driven, pulsed electron source in an otherwise conventional transmission electron microscope. We demonstrate precise control - at the single electron level - over the emission timing and the number of electrons emitted with each femtosecond laser pulse. We find that radiation damage is significantly reduced for such pulsed beams when compared to conventional ultralow-dose methods for the same dose rate and the same total dose. We also show that the degree of damage can be controlled by carefully varying the time between arrival of each electron at the specimen and by changing the number of electrons in each packet.<br>

scholarly journals Reducing Radiation Damage in Soft Matter with Femtosecond Timed Single-Electron Packets

2019 ◽  
Author(s):  
Elisah VandenBussche ◽  
David Flannigan
Keyword(s):  
Electron Microscope ◽  
Laser Pulse ◽  
Femtosecond Laser ◽  
Radiation Damage ◽  
Soft Matter ◽  
Single Electron ◽  
Electron Level ◽  
Precise Control ◽  
Transmission Electron ◽  
Conventional Transmission Electron Microscope

We study the effects on radiation damage of using a femtosecond laser-driven, pulsed electron source in an otherwise conventional transmission electron microscope. We demonstrate precise control - at the single electron level - over the emission timing and the number of electrons emitted with each femtosecond laser pulse. We find that radiation damage is significantly reduced for such pulsed beams when compared to conventional ultralow-dose methods for the same dose rate and the same total dose. We also show that the degree of damage can be controlled by carefully varying the time between arrival of each electron at the specimen and by changing the number of electrons in each packet.<br>

scholarly journals Controlled emission time statistics of a dynamic single-electron transistor

2021 ◽  
Vol 7 (2) ◽  
pp. eabe0793
Author(s):  
Fredrik Brange ◽  
Adrian Schmidt ◽  
Johannes C. Bayer ◽  
Timo Wagner ◽  
Christian Flindt ◽  
...  
Keyword(s):  
Single Particle ◽  
Modulation Frequency ◽  
Waiting Times ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Nonadiabatic Dynamics ◽  
Electron Level ◽  
Emission Time ◽  
The Time Domain ◽  
Future Technologies

Quantum technologies involving qubit measurements based on electronic interferometers rely critically on accurate single-particle emission. However, achieving precisely timed operations requires exquisite control of the single-particle sources in the time domain. Here, we demonstrate accurate control of the emission time statistics of a dynamic single-electron transistor by measuring the waiting times between emitted electrons. By ramping up the modulation frequency, we controllably drive the system through a crossover from adiabatic to nonadiabatic dynamics, which we visualize by measuring the temporal fluctuations at the single-electron level and explain using detailed theory. Our work paves the way for future technologies based on the ability to control, transmit, and detect single quanta of charge or heat in the form of electrons, photons, or phonons.

Evaluation of single-electron movies of glutamine synthetase molecules

1983 ◽  
Vol 41 ◽  
pp. 280-281
Author(s):  
W. Kunath ◽  
E. Zeitler ◽  
M. Kessel
Keyword(s):  
Electron Microscope ◽  
Glutamine Synthetase ◽  
Electron Irradiation ◽  
Structural Damage ◽  
Structural Changes ◽  
Single Electron ◽  
Continuous Series ◽  
Digital Recording ◽  
Recording Device ◽  
Low Exposure

The features of digital recording of a continuous series (movie) of singleelectron TV frames are reported. The technique is used to investigate structural changes in negatively stained glutamine synthetase molecules (GS) during electron irradiation and, as an ultimate goal, to look for the molecules' “undamaged” structure, say, after a 1 e/Å2 dose.The TV frame of fig. la shows an image of 5 glutamine synthetase molecules exposed to 1/150 e/Å2. Every single electron is recorded as a unit signal in a 256 ×256 field. The extremely low exposure of a single TV frame as dictated by the single-electron recording device including the electron microscope requires accumulation of 150 TV frames into one frame (fig. lb) thus achieving a reasonable compromise between the conflicting aspects of exposure time per frame of 3 sec. vs. object drift of less than 1 Å, and exposure per frame of 1 e/Å2 vs. rate of structural damage.

Single-electron sensitivity with a lens-coupled CCD camera

1993 ◽  
Vol 51 ◽  
pp. 642-643
Author(s):  
G.Y. Fan ◽  
Bruce Mrosko ◽  
Mark H. Ellisman
Keyword(s):  
Focal Length ◽  
Thick Layer ◽  
Ccd Camera ◽  
Single Electron ◽  
Bottom Flange ◽  
X Rays ◽  
Red Phosphor ◽  
Ccd Detector ◽  
Lens Assembly ◽  
Efficient Coupling

A lens coupled CCD camera showing single electron sensitivity has been built for TEM applications. The design is illustrated in Fig. 1. The bottom flange of a JEM-4000EX microscope is replaced by a special flange which carries a large rectangular leaded glass window, 22 mm thick. A 20 μm thick layer of red phosphor is coated on the window, and the entire window is sputter-coated with a thin layer of Au/Pt. A two-lens relay system is used to provide efficient coupling between the image on the phosphor scintillator and the CCD imager. An f1.0 lens (Goerz optical) with front focal length 71.6 mm is used as the collector. A mirror prism, of the Amici type, is used to "bend" the optical path by 90° to prevent X-rays which may penetrate the leaded glass from hitting the CCD detector. Images may be relayed directly to the camera (1:1) or demagnified by a factor of up to 3:1 by moving the lens assembly.

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