scholarly journals Volume and concentration dosing in picolitres using a two-channel microfluidic AFM cantilever

Nanoscale ◽  
2020 ◽  
Vol 12 (18) ◽  
pp. 10292-10305
Author(s):  
E. J. Verlinden ◽  
M. Madadelahi ◽  
E. Sarajlic ◽  
A. Shamloo ◽  
A. H. Engel ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Atomic Force Microscopy Cantilever

We introduce a two-channel microfluidic atomic force microscopy cantilever that can be used both for nanomechanical sensing and to manipulate liquids at the rate of femto-litres per second through nanoscale apertures near the cantilever tip apex.

scholarly journals Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

2016 ◽  
Vol 109 (4) ◽  
pp. 043111 ◽  
Author(s):  
R. Wagner ◽  
T. J. Woehl ◽  
R. R. Keller ◽  
J. P. Killgore
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Beam ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Cantilever

scholarly journals PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY

2017 ◽  
Author(s):  
Sudipta Dutta ◽  
Mahesh Kumar Singh ◽  
M. S. Bobji
Keyword(s):  
Atomic Force Microscopy ◽  
Magnetic Interaction ◽  
Interaction Force ◽  
Small Scale ◽  
Magnetic Composite ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lift Height ◽  
Afm Cantilever ◽  
Force Displacement

Atomic force microscopy based force-displacement spectroscopy is used to quantify magnetic interaction force between sample and magnetic cantilever. AFM based F–D spectroscopy is used widely to understand various surface-surface interaction at small scale. Here we have studied the interaction between a magnetic nanocomposite and AFM cantilevers. Two different AFM cantilever with same stiffness but with and without magnetic coating is used to obtain F–D spectra in AFM. The composite used has magnetic Ni nanophase distributed uniformly in an Alumina matrix. Retrace curves obtained using both the cantilevers on magnetic composite and sapphire substrate are compared. It is found for magnetic sample cantilever comes out of contact after traveling 100 nm distance from the actual point of contact. We have also used MFM imaging at various lift height and found that beyond 100nm lift height magnetic contrast is lost for our composite sample, which further confirms our F–D observation.

Elastic Recovery Measurements Performed by Atomic Force Microscopy and Standard Nanoindentation on a Co(10.1) Monocrystal

2002 ◽  
Vol 17 (6) ◽  
pp. 1258-1265 ◽  
Author(s):  
J. C. Arnault ◽  
A. Mosser ◽  
M. Zamfirescu ◽  
H. Pelletier
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Recovery ◽  
Intrinsic Parameter ◽  
Force Microscopy ◽  
Atomic Force ◽  
Material Hardness ◽  
Important Discrepancy ◽  
Shape Effects ◽  
Afm Cantilever ◽  
Hardness Values

Atomic force microscopy (AFM) nanoindentation experiments were performed on a Co(10.1) monocrystal. Using AFM line scans, we deduced the elastic recovery, which is an intrinsic parameter of the studied material. The comparison of these elastic recovery values with those calculated by standard nanoindentation shows a fair agreement for forces higher than 400 μN with an important discrepancy for lower forces. This difference is attributed to tip shape effects and to the AFM cantilever elastic deformation. Furthermore, the material hardness was measured from AFM images of the imprint by considering the lateral dimension L. In this case, the obtained values are practically independent from the applied load. Moreover, a simple model based on geometrical considerations is proposed to correct hardness values calculated from the residual depth.

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