Adsorption, surface relaxation and electrolyte structure at Pt(111) electrodes in non-aqueous and aqueous acetonitrile electrolytes

2019 ◽  
Vol 21 (17) ◽  
pp. 8654-8662 ◽  
Author(s):  
Gary S. Harlow ◽  
Iain M. Aldous ◽  
Paul Thompson ◽  
Yvonne Gründer ◽  
Laurence J. Hardwick ◽  
...  
Keyword(s):  
Atomic Structure ◽  
Surface Relaxation ◽  
Aqueous Acetonitrile ◽  
X Ray ◽  
X Ray Scattering ◽  
Adsorption Surface ◽  
P Application ◽  
Ray Scattering

Application of synchrotron X-ray scattering to probe the atomic structure of the interface between Pt(111) electrodes and non-aqueous acetonitrile electrolytes.

Local Atomic Structure and Conduction Mechanism of Nanocrystalline Hydrous RuO2from X-ray Scattering

2002 ◽  
Vol 106 (49) ◽  
pp. 12677-12683 ◽  
Author(s):  
Wojtek Dmowski ◽  
Takeshi Egami ◽  
Karen E. Swider-Lyons ◽  
Corey T. Love ◽  
Debra R. Rolison
Keyword(s):  
Atomic Structure ◽  
Conduction Mechanism ◽  
Local Atomic Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray Scattering

1991 ◽  
Vol 239 ◽  
Author(s):  
Ramnath Venkatraman ◽  
Paul R. Besser ◽  
Sean Brennan ◽  
John C. Bravman
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
Line Broadening ◽  
X Ray ◽  
Relaxation Effects ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTWe have measured elastic strain distributions with depth as a function of temperature in Al thin films of various thicknesses on oxidized silicon using synchrotron grazing incidence X-ray scattering (GIXS). Disregarding minor surface relaxation effects that depend on the film thickness, it is shown that there are no gross strain gradients in these films in the range of temperatures (between room temperature and 400°C) considered. We also observe X-ray line broadening effects, suggesting an accumulation of dislocations on cooling the films, and their annealing out as the films are reheated.

Atomic structure of binary amorphous alloys by combined EXAFS and X-ray scattering

1995 ◽  
Vol 208-209 ◽  
pp. 375-376 ◽  
Author(s):  
Yu.A. Babanov ◽  
V.R. Schvetsov ◽  
A.F. Sidorenko
Keyword(s):  
Atomic Structure ◽  
Amorphous Alloys ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Changes in the atomic structure through glass transition observed by X-ray scattering

2012 ◽  
Vol 23 ◽  
pp. 111-115 ◽  
Author(s):  
Cang Fan ◽  
H.G. Yan ◽  
C.T. Liu ◽  
H.Q. Li ◽  
P.K. Liaw ◽  
...  
Keyword(s):  
Glass Transition ◽  
Atomic Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In-Situ Atomic Structure of Underpotentially Deposited Monolayers of Pb and Tl on Au(111) and Ag(111): A Surface X-ray Scattering Study

1995 ◽  
Vol 99 (13) ◽  
pp. 4733-4744 ◽  
Author(s):  
Michael F. Toney ◽  
Joseph G. Gordon ◽  
Mahesh G. Samant ◽  
Gary L. Borges ◽  
Owen R. Melroy ◽  
...  
Keyword(s):  
Atomic Structure ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Underpotentially Deposited ◽  
Ray Scattering

Determination Of The α-Al2O3(0001) Surface Relaxation and Termination by Measurements of Crystal Truncation Rods

1996 ◽  
Vol 437 ◽  
Author(s):  
P. Guenard ◽  
G. Renaud ◽  
A. Barbier ◽  
M. Gautier-Soyer
Keyword(s):  
Surface Structure ◽  
Chemical Nature ◽  
Theoretical Calculations ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
X Ray ◽  
X Ray Scattering ◽  
Α Al2o3 ◽  
Ray Scattering

AbstractWe have investigated the unreconstructed (0001) surface structure of sapphire (α-Al2O3) by Grazing Incidence X-ray Scattering. Modulations along the crystal truncation rods were analyzed in order to determine the chemical nature of the terminating plane, and the structural relaxations of the first few atomic planes below the surface. The most likely model yields a single Al layer termination with relaxations of the first four planes of -51%, +16%, -29% and +20% respectively. These results compare well with the most recent theoretical calculations on this surface.

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